Electronic Fuse Control Circuit With Selectable Reference Resistors
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Solution Overview
Problem
The variability in resistance values of antifuses during manufacturing makes it challenging to accurately identify their programmed state using a reference resistor, leading to increased costs and reduced manufacturing efficiency due to the need for additional processes to replace the reference resistor.
Innovation Solution
An electronic fuse control circuit with a program voltage pad, a fuse element, a latch, an operation switch unit, and multiple bonding option units with resistors and selection switches, allowing for the selection of a proper bonding option unit based on the resistance of the fuse element during wafer probing and packaging, ensuring accurate read operations without requiring additional manufacturing steps.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a reference resistor is used to identify the programmed state of antifuses, then the read operation can be performed, but the variability in antifuse resistance values causes incorrect identification and requires additional manufacturing processes to replace the reference resistor
Solution Approach 1:
The patent applies parameter changes by providing multiple reference resistors with different resistance values (first reference resistor with first resistance value, second reference resistor with second resistance value) to match the variability range of antifuse resistance values. This allows the system to adapt to different antifuse resistance characteristics without requiring manufacturing process changes.
Solution Approach 2:
The patent implements universality by designing the circuit to support multiple reference resistor options that can handle different antifuse resistance scenarios. The circuit can universally accommodate various antifuse resistance values by selecting the appropriate reference resistor, eliminating the need for separate manufacturing processes for different resistance cases.
2Measurement precision
If additional manufacturing processes are implemented to replace the reference resistor for accurate identification, then the measurement precision improves, but the manufacturing cost increases and productivity decreases
Solution Approach 1:
The patent applies preliminary action by pre-configuring multiple reference resistors with different resistance values into the circuit design before manufacturing. This preliminary preparation ensures that the appropriate reference resistor is already available in the circuit, eliminating the need for post-manufacturing replacement processes and maintaining high manufacturing efficiency.
Solution Approach 2:
The patent uses copying by creating multiple copies of reference resistors with different resistance values within the same circuit. Instead of manufacturing different circuits separately, the patent copies the reference resistor structure with varying resistance parameters to cover the full range of antifuse resistance variability.
3Device complexity
If a single reference resistor value is used for all antifuses, then the device complexity is reduced, but the variability in antifuse resistance values leads to incorrect read operations
Solution Approach 1:
The patent applies dynamics by enabling the selection of different reference resistors based on the actual antifuse resistance characteristics. The circuit can dynamically adapt to different resistance conditions by choosing the appropriate reference resistor, maintaining reliability without requiring complex manual intervention.
Solution Approach 2:
The patent uses segmentation by dividing the reference resistor function into multiple discrete resistance value options (first reference resistor, second reference resistor). This segmentation allows the system to handle different antifuse resistance ranges with dedicated reference resistors while maintaining a relatively simple overall circuit structure.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables accurate identification of the programmed state of antifuses by selecting the appropriate bonding option unit with suitable resistance, eliminating the need for additional manufacturing processes and ensuring the accuracy of read operations.
Implementation Method 1
when a program voltage VH is applied to the gate G1 and a ground voltage is applied to the active region A1, a resulting high voltage applied to the antifuse AF1 breaks down the gate oxide of the gate G1, thereby generating a low resistance path between the gate G1 and the active region A1
Implementation Method 2
a reference resistor may be adopted for voltage division with the antifuse AF1, so that a condition of the antifuse AF1 can be identified by the resulting divisional voltage
Data Source
AI summary
The present application discloses a method for preparing a semiconductor device including an electronic fuse control circuit. The method includes providing a chip including an electronic fuse control circuit, wherein the electronic fuse control circuit includes a program voltage pad, a fuse element, a latch, a plurality of resistor selection pads, and a plurality of bonding option units. The method further includes providing a substrate including a first voltage bonding pad and a plurality of second voltage bonding pads, disposing the chip on the substrate, bonding the first voltage bonding pad to the program voltage pad, and bonding at least one of the plurality of second voltage bonding pads to at least one of the plurality of resistor selection pads.