Characterizing Multi-Port Electrical Components Using Eigenvector Voltage Patterns
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Solution Overview
Problem
Conventional methods for characterizing the linear properties of electrical multi-port components face challenges due to limited precision and electric noise, particularly when eigenvalues of the characteristics matrices differ significantly in magnitude, leading to information loss and imprecise description of interactions between components or subsystems.
Innovation Solution
A method and device that apply voltage patterns corresponding to the eigenvectors of the estimated admittance matrix to measure the response of electrical multi-port components, allowing for more accurate characterization by measuring currents at each port, and utilizing adjustable voltage sources and current sensors to refine measurements, especially at critical frequencies.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of manufacture
If conventional measurement methods are used to measure admittance matrix elements, then measurement can be performed with standard equipment, but measurement precision deteriorates when eigenvalues differ significantly in magnitude due to limited precision and electric noise
Solution Approach 1:
The invention performs preliminary diagonalization of the admittance matrix to identify eigenvectors and eigenvalues before the actual measurement. This preliminary analysis allows the measurement system to be configured optimally by applying voltage patterns corresponding to eigenvectors, which prevents information loss that would occur with conventional methods when eigenvalues differ significantly in magnitude.
Solution Approach 2:
The invention changes the measurement parameters from conventional port-by-port voltage application to applying specific voltage patterns that correspond to the eigenvectors of the admittance matrix. This parameter transformation allows the measurement to be performed in the eigenbasis, where the coupling between measurements is minimized and precision is maximized even when eigenvalues vary widely.
2Device complexity
If conventional measurement procedures are used, then measurement process is simple, but information is lost when eigenvalues of characteristics matrices strongly differ in magnitude
Solution Approach 1:
The invention performs preliminary diagonalization of the admittance matrix to identify eigenvectors and eigenvalues before the actual measurement. This preliminary analysis allows the measurement system to be configured optimally by applying voltage patterns corresponding to eigenvectors, which prevents information loss that would occur with conventional methods when eigenvalues differ significantly in magnitude.
Solution Approach 2:
The invention introduces eigenvectors as an intermediary transformation between the physical port voltages and the measured currents. By transforming the measurement basis to the eigenbasis through this intermediary, the measurement process preserves all information about the system's linear properties without the information loss that occurs in conventional direct measurement when eigenvalues vary widely.
3Measurement precision
If multiple voltage patterns corresponding to eigenvectors are applied, then measurement precision is improved, but measurement procedure becomes more complex
Solution Approach 1:
The invention makes the measurement system self-configuring by automatically calculating the eigenvectors from the admittance matrix and using these eigenvectors to determine the optimal voltage patterns for measurement. This self-service approach eliminates the need for manual configuration and reduces operational complexity despite the sophisticated measurement procedure.
Solution Approach 2:
The invention uses feedback by measuring currents in response to applied voltage patterns, then using this measurement data to refine the estimate of the admittance matrix. The process iterates with feedback loops that adjust the voltage patterns based on the current estimate of eigenvectors, progressively improving measurement precision while the automated control manages the procedural complexity.
Data Source
AI summary
A method and device for determining the linear response of an electrical multi-port component has an “estimation procedure” in which an estimated admittance matrix is determined by applying voltages to the ports of the component and measuring the response of the component. The estimation procedure can e.g. consist of a conventional measurement of the admittance matrix. The method further has a “measurement procedure” in which several voltage patterns are applied to the port. The voltage patterns correspond to the eigenvectors of the estimated admittance matrix. For each applied voltage pattern, the response of the component is measured. This allows to measure the linear response of the component accurately even if the eigenvalues of the admittance matrix differ by several orders of magnitude.