Electroluminescent Display Hot Spot Detection Circuit

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Solution Overview

Problem

Electroluminescent display apparatuses suffer from hot spot defects due to subpixel short circuits, which degrade display quality and reduce the lifespan and reliability of products.

Innovation Solution

An electroluminescent display apparatus with a detection system that includes a panel driving circuit, a reference voltage generating circuit, a comparator, and a logic circuit to detect and compensate for subpixel short circuits by comparing voltage levels on detection lines, thereby determining defect occurrence and adjusting pixel operation.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a detection system is added to detect and compensate for hot spot defects, then display quality and reliability are improved, but device complexity increases

Engineering Contradiction:
Improvedisplay reliabilityVSAvoidcircuit complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The detection line is merged with the existing data line structure, allowing the same physical line to serve both data transmission and defect detection functions. The detection circuit shares components with the driving circuit, including the data line, transistor structures, and voltage generation circuits, thereby reducing overall system complexity while maintaining reliable defect detection capability

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The detection line serves multiple functions: it acts as a data transmission line during normal operation and as a detection line during defect detection intervals. The same circuit components, including transistors and voltage generation circuits, are reused for both driving and detection functions, minimizing additional hardware requirements while achieving improved reliability

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Manufacturing precision

If a detection system is added to detect and compensate for hot spot defects, then display quality is improved, but manufacturing cost increases

Engineering Contradiction:
Improvedisplay qualityVSAvoidmanufacturing cost
Core Design Contradiction:
Manufacturing precisionVSEase of manufacture

Solution Approach 1:

The detection functionality is merged into the existing pixel structure by utilizing the same data line as a detection line and sharing transistor components. This integration approach avoids the need for separate detection circuits, thereby reducing manufacturing complexity and cost while maintaining high display quality through effective defect detection and compensation

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The pixel structure itself provides defect detection capability through its inherent components. The detection line and associated transistors are part of the standard pixel structure, allowing the display to self-diagnose defects without requiring external or additional specialized detection hardware, thus keeping manufacturing costs low while achieving high display quality

Inventive Principle:
Principle #25Self-service

Data Source

PatentUS11810502B2Electroluminescent display apparatus
Publication Date: 2023.11.07 LG DISPLAY CO LTD
  • US11810502B2 patent drawing
  • US11810502B2 patent drawing
  • US11810502B2 patent drawing

AI summary

An electroluminescent display apparatus including a pixel connected to a detection line; a panel driving circuit configured to off-drive a driving element included in the pixel in a detection interval; a reference voltage generating circuit configured to supply a detection reference voltage to the detection line prior to the detection interval, generate a first comparator reference voltage which is higher than the detection reference voltage in the detection interval, and generate a second comparator reference voltage which is lower than the detection reference voltage in the detection interval; a comparator configured to compare the first comparator reference voltage with a voltage of the detection line to generate a first comparison output at a first timing of the detection interval and comparing the second comparator reference voltage with the voltage of the detection line to generate a second comparison output at a second timing of the detection interval; and a logic circuit configured to determine an occurrence of a defect of the pixel based on the first comparison output and the second comparison output and to perform dark spot processing of the defective pixel.