EL Display Luminance Uniformity via Dual-Resolution Measurement
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Solution Overview
Problem
Manufacturing large-size organic EL light-emitting elements with uniform luminance is challenging due to variations in the manufacturing process, leading to nonuniform light emission across pixels even when the same driving signal is applied.
Innovation Solution
A method involving two luminance measurement steps using imaging apparatuses of different resolutions to obtain and correct luminance data for each pixel, ensuring uniform light emission by treating groups of pixels as one unit for measurement and correction.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a single high-resolution imaging apparatus is used to measure all pixels individually, then measurement precision is improved, but measurement time and device complexity increase
Solution Approach 1:
The measurement process is segmented into two distinct phases: a first luminance measurement step using a high-resolution imaging apparatus to capture individual pixel luminance data, and a second luminance measurement step using a low-resolution imaging apparatus to capture group luminance data. This segmentation allows the patent to obtain precise individual pixel measurements efficiently by combining the strengths of both measurement approaches, reducing total measurement time while maintaining precision through the correction process.
2Measurement precision
If a high-resolution imaging apparatus measures all pixels individually, then measurement precision is improved, but device complexity and cost increase
Solution Approach 1:
The patent merges the functions of two imaging apparatuses with different resolutions into a unified measurement system. The high-resolution apparatus provides precise individual pixel data, while the low-resolution apparatus provides group-level verification data. By combining these two measurement systems and integrating their data through the correction process, the patent achieves high measurement precision without relying solely on a complex high-resolution system for all measurements, thereby reducing overall device complexity and cost.
3Manufacturing precision
If luminance data is corrected using group-level measurements, then manufacturing precision is improved, but measurement process complexity increases
Solution Approach 1:
The patent implements a feedback mechanism where luminance data from the first high-resolution measurement is corrected using luminance data from the second low-resolution group measurement. The correction value derived from group-level measurements is applied back to individual pixel measurements to compensate for manufacturing variations. This feedback loop improves luminance uniformity across the display by using aggregate group data to refine individual pixel characteristics, achieving high manufacturing precision through a systematic correction process.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach ensures more uniform luminance across the display screen, improving manufacturing yields and overall performance of EL display devices.
Implementation Method 1
a first luminance measurement step in which luminance data of each one of all the pixels is obtained by using a first imaging apparatus
Data Source
AI summary
A method of manufacturing an EL display device having a light emitting part, in which a plurality of pixels are arrayed, and a thin-film transistor array device to control light emission of the light emitting part, includes a luminance measurement step of obtaining luminance data of pixel, with the light emitting part being lit. The luminance measurement step includes a first luminance measurement step and a second luminance measurement step. In the first luminance measurement step, a first imaging apparatus obtains luminance data by measuring light emission of the each pixel. The first apparatus has a resolution corresponding to that of the pixels of the light emitting part. In the second luminance measurement step after the first step, a second imaging apparatus measures light emission of a plurality of the pixels to correct the luminance data of the each pixel obtained in the first luminance measurement step. The second imaging apparatus is lower in resolution than the first imaging apparatus.