Elastic Contact Structure Alignment in Testing Device
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Solution Overview
Problem
Conventional testing devices face instability due to inconsistent swaying directions of elastic contact structures after assembly, leading to unstable contact with the device under test (DUT).
Innovation Solution
The design incorporates a testing device with a top guiding board and a bottom guiding board, where the elastic contact structures have a target offset (d1) and a testing device offset (d2) that satisfy the equation d2 = d1 ± 50˜200 μm, ensuring the swaying directions of the elastic contact structures are aligned after assembly.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of manufacture
If elastic contact structures are assembled by first fixing them on the bottom guiding board and then assembling the top guiding board, then the assembly process is simple, but the swaying directions of the elastic contact structures become inconsistent leading to unstable contact with DUT
Solution Approach 1:
The patent applies preliminary action by pre-setting the target elastic contact structure offset d1 during the elastic contact structure design phase, and pre-establishing the testing device offset d2 between the top and bottom guiding boards according to the relationship d2=d1±50˜200 μm. This preliminary configuration ensures that when the elastic contact structures are assembled through the penetrating openings, their swaying directions are automatically aligned toward the same direction, achieving stable contact with DUT without requiring complex post-assembly adjustments.
2Ease of operation
If the top guiding board and bottom guiding board are aligned without offset, then the assembly is straightforward, but the elastic contact structures sway in different directions causing contact instability
Solution Approach 1:
The patent applies asymmetry by deliberately introducing a controlled testing device offset d2 between the top guiding board and bottom guiding board, breaking the perfect alignment symmetry. This asymmetric offset is precisely designed to match the target elastic contact structure offset d1 through the relationship d2=d1±50˜200 μm, transforming the previously random multi-directional swaying into consistent unidirectional swaying toward the same direction, thereby improving contact stability.
3Adaptability or versatility
If elastic contact structures are made more flexible to improve contact adaptability, then they can better conform to DUT contacts, but their swaying directions become less consistent
Solution Approach 1:
The patent applies local quality by differentiating the functional characteristics of different parts of the elastic contact structure. The body section is designed with specific elastic properties to provide flexibility and adaptability for conforming to DUT contacts, while the tip section and tail section are configured to work with the offset mechanism to ensure consistent swaying directions. This localized functional differentiation allows the structure to simultaneously achieve both adaptability and directional consistency.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This alignment enables stable contact with the DUT and ensures consistent swaying directions of the elastic contact structures, enhancing the integrity and reliability of the testing process.
Implementation Method 1
Elastic contact structures are disposed between the top guiding board and the bottom guiding board, and each of the elastic contact structures has a tip section, a body section, and a tail section in sequence
Data Source
AI summary
A testing device utilized in a testing apparatus includes a top guiding board having top penetrating openings, a bottom guiding board disposed at one side of the top guiding board and having bottom penetrating openings, and elastic contact structures disposed between the top guiding board and the bottom guiding board. A testing device offset (represented by d2) exists between the top guiding board and the bottom guiding board. Each elastic contact structure has a tip section, a body section, and a tail section in sequence. The elastic contact structures pass through the top penetrating openings and the bottom penetrating openings respectively. Each elastic contact structure has an elastic contact structure offset between the tip section and the tail section. Each elastic contact structure has a target elastic contact structure offset (represented by d1), in which d1 and d2 satisfy the following equation:d2=d1±50˜200 μm.