Elastic Probe Card Contact Structure to Suppress Sparking
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Solution Overview
Problem
Existing probe cards and probes are prone to spark generation and burnout due to gaps or positional shifts during high-current testing, leading to probe removal issues.
Innovation Solution
The probe is designed with its board-side end constantly in contact with the circuit board, utilizing elastic support portions to maintain electrical connection and prevent separation, thereby suppressing spark generation and ensuring reliable contact.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the probe is not constantly contacted with the circuit board, then the probe structure is simpler and easier to manufacture, but spark generation and burnout occur during high-current testing
Solution Approach 1:
The probe is designed with elastic support portions that allow dynamic movement. The probe can elastically deform to maintain constant contact with the circuit board while accommodating positional variations, transforming a static rigid structure into a dynamic adaptive one that ensures reliable electrical connection without complex additional components
Solution Approach 2:
The elastic support portions change the physical state of the probe from rigid to flexible, allowing it to adapt its shape and position. This parameter change enables the probe to maintain constant contact pressure and electrical connection, preventing spark generation during high-current testing while keeping the overall structure relatively simple
2Object-affected harmful factors
If elastic support portions are added to maintain constant contact, then spark generation is suppressed, but the device complexity increases
Solution Approach 1:
The probe incorporates elastic support portions that function as flexible elements. These elastic portions allow the probe to adapt to positional variations and maintain constant contact with the circuit board, suppressing spark generation during high-current testing while adding minimal structural complexity
Solution Approach 2:
The elastic support portions act as a cushioning mechanism that anticipates and compensates for positional shifts or gaps between the probe and circuit board. By providing this elastic cushioning in advance, the design prevents harmful sparks from occurring during high-current testing without requiring complex active control systems
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Prevents spark-induced burnout and probe removal, enhancing the durability and reliability of the probe card by ensuring consistent electrical contact.
Implementation Method 1
an elastic support portion (36) elastically supporting the main body portion (35)
Data Source
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AI summary
Occurrence of a spark is suppressed, and burnout or removal of a probe is prevented in a probe of the present invention. The probe of the present invention is a probe provided with a linear main body portion having a tip in contact with an electrode of a member to be tested in a state where a board-side end is in contact with the circuit board side of a probe card and an elastic support portion which is provided on a board-side end portion of the main body portion and elastically supports the main body portion on the probe card side. The elastic support portion has its base end side integrally fixed to the board-side end portion of the main body portion and is formed with the distal end side directed toward the tip portion of the main body portion and curved having an arc shape toward the main body portion side. Moreover, two pieces of the elastic support portion are provided symmetrically on the both sides sandwiching the main body portion on the board-side end portion of the main body portion and they are configured by being curved, each having an arc shape with the same radius of curvature. The above-described probe is used as a probe to be provided in plural in the probe card.