Elastic Probe Head Structure for Multi-Device Contact Stability

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Solution Overview

Problem

Existing probe heads face challenges in simultaneously testing multiple electrical devices due to mismatched terminal heights and damage from repeated contact impacts and loads.

Innovation Solution

A probe head design featuring an elastic body composed of stacked layers with embedded electrodes, incorporating independent elasticity between probe pins to absorb and distribute contact forces.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If a probe head mechanically contacts the electrical device to provide electrical connection, then testing efficiency is improved, but the probe head may be damaged due to accumulated impact and load from repeated contact

Engineering Contradiction:

Improvetesting efficiencyVSAvoidprobe head durability

Core Design Contradiction:

ProductivityVSReliability

Solution Approach 1:

The patent applies beforehand cushioning by incorporating an elastic body between the probe tip and the rigid structure. This elastic body acts as a pre-positioned shock absorber that cushions the impact and load from repeated contact with the device under test, preventing damage to the probe head while maintaining testing efficiency

Inventive Principle:

Principle #11Beforehand cushioning (Prior cushioning)

Solution Approach 2:

The patent uses a flexible elastic body (such as rubber or elastomer material) that can deform elastically under contact load. This flexible component absorbs the mechanical stress from repeated probing actions, allowing the probe head to maintain durability while continuously performing electrical connections

Inventive Principle:

Principle #30Flexible shells and thin films

2Productivity

If multiple contact terminals are used to test multiple terminals simultaneously, then productivity is improved, but it becomes difficult to test all terminals simultaneously due to height mismatches

Engineering Contradiction:

Improveparallel testing capabilityVSAvoidcontact reliability

Core Design Contradiction:

ProductivityVSEase of operation

Solution Approach 1:

The patent applies dynamics by making the probe tip structure flexible through the elastic body. This flexibility allows the probe pins to dynamically adjust their positions independently, compensating for height variations in different contact terminals. Each probe pin can move vertically to make reliable contact with terminals at different heights, enabling simultaneous testing of multiple terminals

Inventive Principle:

Principle #15Dynamics

3Measurement precision

If the probe head structure is made rigid for stable electrical connection, then measurement precision is improved, but impact and load during contact cause damage

Engineering Contradiction:

Improveelectrical connection stabilityVSAvoidimpact and load damage

Core Design Contradiction:

Measurement precisionVSObject-affected harmful factors

Solution Approach 1:

The patent applies segmentation by dividing the probe head into distinct functional zones: a rigid upper portion for stable electrical connection and measurement, and a flexible elastic body portion for absorbing impact and load. This segmentation allows each part to perform its optimal function - the rigid part ensures measurement precision while the elastic part protects against damage

Inventive Principle:

Principle #1Segmentation

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables simultaneous inspection of multiple devices, reduces damage to both the probe head and devices, and enhances inspection stability and reliability.

Implementation Method 1

capable of absorbing shock or load generated during inspection through an elastic body

Methodology Applied

Scientific EffectElasticity: Elasticity

Data Source

PatentUS20250341541A1Probe-head for electrical device inspection and manufacturing method thereof

Publication Date: 2025.11.06 NANO X CO LTD

AI summary

Disclosed is a probe-head capable of simultaneously inspecting a plurality of devices under test. The probe head includes an elastic body formed by laminating a plurality of elastic layers, with an electrode portion embedded therein. This structure efficiently absorbs shock or load that occurs during contact with the devices under test, preventing damage to both the devices and the probe head. Furthermore, the present invention allows for the simultaneous inspection of multiple electrical devices, significantly reducing inspection time. Additionally, independent elasticity between the probe pins improves inspection stability and reliability.