Elastic Conductive Probe Socket Structure to Prevent Short-Circuiting

Resolve Bottlenecks,
Find Innovative SolutionsGenerate Solutions

Solution Overview

Problem

Conventional test sockets experience reliability issues due to short-circuiting between conductive portions caused by deformation during testing, which deforms the insulating base and adjacent conductive particles, leading to unreliable electrical connections.

Innovation Solution

A test socket design featuring a base frame with probe holes and conductive probes made of elastic material containing conductive particles, where the base frame is insulated and the probes are independently deformable without deforming the base frame, using a volume ratio of conductive particles to elastic material of 3-6:1 to maintain conductivity and durability.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If the insulating base is made of silicone material with conductive portions, then the test socket can achieve electrical connection during testing, but the insulating base deforms under pressure causing adjacent conductive particles to short-circuit

Engineering Contradiction:

Improvetest reliabilityVSAvoidbase frame insulation stability

Core Design Contradiction:

ReliabilityVSStability of the object's composition

Solution Approach 1:

The invention divides the structure into separate components: a base frame made of insulating material and conductive probes made of elastic material with conductive particles. This segmentation isolates the conductive elements from the insulating base, preventing short-circuits while maintaining electrical connection functionality during testing.

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

The conductive probes are formed using composite material consisting of elastic material containing conductive particles. This composite structure provides both the elasticity needed for deformation during testing and the conductivity required for electrical connection, while the insulating base frame maintains its structural stability.

Inventive Principle:

Principle #40Composite materials

2Reliability

If conductive portions are crowded with conductive particles to enable conductivity, then electrical connection is achieved, but deformation causes adjacent conductive particles to contact and short-circuit

Engineering Contradiction:

Improveelectrical connection reliabilityVSAvoidshort-circuit between probes

Core Design Contradiction:

ReliabilityVSObject-affected harmful factors

Solution Approach 1:

Each conductive probe is segmented as an independent unit with its own conductive particles embedded in elastic material. The insulating base frame segments the space between probes, preventing harmful electrical interaction between adjacent probes during deformation.

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

The insulating base frame acts as an intermediary barrier between adjacent conductive probes. It physically separates the probes and prevents conductive particles from different probes from contacting each other, thereby eliminating the short-circuit hazard while allowing each probe to function independently.

Inventive Principle:

Principle #24Intermediary (Mediator)

3Reliability

If the base frame is made of insulating material to prevent short-circuiting, then probe insulation is improved, but the base frame cannot provide the necessary deformation for electrical connection

Engineering Contradiction:

Improveprobe insulationVSAvoiddeformation capability

Core Design Contradiction:

ReliabilityVSEase of operation

Solution Approach 1:

The functionality is segmented between two components: the insulating base frame provides structural stability and electrical insulation, while the separate conductive probes provide deformation capability for electrical connection. This segmentation allows each component to optimize its specific function without compromise.

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

The invention changes the material parameter distribution: the base frame uses insulating material with high structural stability, while the probes use elastic material with high deformability. This parameter differentiation allows the insulating base to maintain insulation while the elastic probes provide the necessary deformation for testing operations.

Inventive Principle:

Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Prevents short-circuiting between probes during testing by maintaining the base frame's insulation, ensuring reliable electrical connections and improved durability through independent probe deformation.

Implementation Method 1

conductive probes... comprising elastic material having higher elastic deformation than the base frame and conductive particles distributed in the elastic material

Methodology Applied

Scientific EffectElastic deformation: Elasticity

Implementation Method 2

applying magnetic force between the first terminal groove and the second terminal groove

Methodology Applied

Scientific EffectMagnetic force: Magnetic Field

Data Source

PatentUS12474373B2Test socket including probes formed of elastic material containing conductive particles and method of manufacturing the same

Publication Date: 2025.11.18 LEENO IND INC

AI summary

Disclosed is a test socket. The test socket includes a base frame shaped like a plate having a plurality of probe holes and conductive probes accommodated in the plurality of probe holes, having terminal portions protruding from both sides of the base frame, and comprising elastic material having higher elastic deformation than the base frame and conductive particles distributed in the elastic material.