Elastic Probe Testing Structure for Miniaturization and Stable Contact
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Solution Overview
Problem
Conventional probe testing devices face challenges in miniaturization due to physical limitations of spring-based designs, which affect current flow and lead to increased parasitic inductance and resistance, and conductive elastomers lack durability and temperature resistance, impacting high-frequency circuit testing accuracy and reliability.
Innovation Solution
A probe testing device with an elastic structure featuring integrally formed probe elements and guide plates, allowing parallel movement of guide plates to maintain alignment and independent elastic forces, reducing size and preventing misalignment, thereby decreasing self-inductance and improving contact stability.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Length of moving object
If a conventional spring-based elastic probe structure is used, then the probe can provide elastic force for contact, but the probe size cannot be further miniaturized due to physical limitations of the spring structure
Solution Approach 1:
The probe element is divided into multiple functional segments: a first contact segment, a body with needle structures, and a second contact segment. This segmentation allows each part to perform its specific function while enabling overall miniaturization. The body section with needle structures provides elastic recovery without requiring a traditional spring mechanism.
Solution Approach 2:
The traditional spring component is extracted and replaced with a body section having needle structures that provide elastic functionality. This extraction eliminates the physical limitations of spring-based designs while maintaining the necessary elastic properties for probe operation.
2Area of moving object
If a conventional spring structure is used in the elastic probe, then elastic force can be provided, but the effective area for current flow is reduced
Solution Approach 1:
The elastic functionality and current conduction pathways are merged into a single integrated structure. The body with needle structures serves both mechanical (elastic recovery) and electrical (current flow) functions, eliminating the need for separate spring components that would occupy space and reduce effective current flow area.
3Manufacturing precision
If the same elastic force is applied to both upper and lower contacts, then structural simplicity is maintained, but misalignment occurs due to varying pressure on the device under test or test substrate
Solution Approach 1:
Different elastic forces are applied to different contact points through the guide plate structure. The guide plate can be elastically deformed to independently adjust the pressing force on the first contact segment and second contact segment, allowing optimization of contact pressure for each interface separately to prevent misalignment.
4Reliability
If conductive elastomer is used instead of elastic probe, then excellent electrical conductivity is achieved, but temperature resistance and service life are reduced
Solution Approach 1:
The probe structure combines conductive materials in the contact segments with elastic materials in the body section. This composite approach integrates the electrical conductivity benefits of conductive materials with the mechanical durability and temperature resistance of elastic materials, achieving both high conductivity and long service life.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The elastic structure effectively reduces probe size, prevents misalignment, and enhances testing accuracy and reliability by minimizing parasitic inductance and ensuring stable contact, extending the device's lifespan.
Implementation Method 1
The third guide plate is configured to perform a parallel movement relative to the first guide plate and the second guide plate in a direction perpendicular to an axis of each of the plurality of probe elements
Implementation Method 2
Each of the plurality of probe elements includes a first contact segment, a second contact segment, and a body. The body includes a plurality of needle structures, and two adjacent ones of the needle structures have a gap arranged therebetween. The plurality of the needle structures are connected to each other through the first contact segment arranged at the first end of the probe element and the second contact segment arranged at the second end of the probe element.
Data Source
AI summary
A probe testing device having an elastic structure is provided. The probe testing device having the elastic structure includes a plurality of probe elements and a guide plate module. Each of the probe elements includes a body, a first contact segment, and a second segment, and is formed integrally. The guide plate module includes a first guide plate, a second guide plate, and a third guide plate that are parallel to each other, and the third guide plate is arranged between the first guide plate and the second guide plate. The plurality of probe elements correspondingly pass through the first guide plate, the second guide plate, and the third guide plate. The third guide plate is configured to perform a parallel movement relative to the first guide plate and the second guide plate in a direction perpendicular to an axis of the probe element.