Elastic-Wave Defect Detection With Stroboscopic Speckle Interferometry
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Solution Overview
Problem
Conventional defect detection devices require users to manually adjust vibration frequencies for each measurement, consuming time and labor due to the unknown size of defects, which affects the signal-to-noise ratio and detection efficiency.
Innovation Solution
A defect detection device and method that includes an exciter to induce multiple vibrations at different frequencies, an illuminator for stroboscopic illumination, and a displacement measurer to control illumination timing and phase, allowing batch measurements at varying phases to determine displacements without manual frequency adjustment.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If manual frequency adjustment is performed for each measurement, then detection accuracy can be optimized for specific defect sizes, but user time and labor consumption increase significantly
Solution Approach 1:
The system pre-calculates and stores optimal frequency settings corresponding to different defect sizes before measurement begins. When a defect is detected, the system automatically retrieves and applies the pre-prepared frequency setting, eliminating the need for manual adjustment during measurement.
Solution Approach 2:
The system performs automatic frequency selection and adjustment based on detected defect characteristics. The measurement device autonomously determines the appropriate frequency and configures itself without requiring user intervention, making the system serve itself in the frequency-setting task.
2Reliability
If multiple frequency measurements are performed to ensure comprehensive defect detection, then detection reliability improves, but measurement time and operational complexity increase
Solution Approach 1:
The system performs measurements at multiple predetermined frequencies in a periodic sequence. By automatically cycling through multiple frequency settings and aggregating results, the system achieves comprehensive defect detection while maintaining efficient automated operation without manual reconfiguration between measurements.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables efficient defect detection by reducing user intervention in frequency setting, improving detection efficiency and accuracy by capturing displacements at multiple phases and frequencies, thereby enhancing defect visibility and reducing operational time and labor.
Implementation Method 1
an exciter configured to induce elastic waves in a test object by sequentially giving the test object a plurality of kinds of vibrations whose frequencies are different from each other
Implementation Method 2
an illuminator configured to perform stroboscopic illumination on a measurement area on the surface of the test object
Implementation Method 3
a displacement measurer configured to control the timing of the stroboscopic illumination and the phase of the elastic wave for each of the plurality of kinds of vibrations so as to perform a batch measurement of displacements, in the off-plane direction of the surface, of the points within the measurement area at least at three phases of the elastic wave which are different from each other, using speckle interferometry or speckle-shearing interferometry
Data Source
AI summary
An exciter (11, 12) induces an elastic wave in a test object by sequentially giving the object multiple kinds of vibrations having different frequencies. An illuminator (13, 14) performs stroboscopic illumination on a measurement area on the surface of the object. A displacement measurer (15) controls the timing of the stroboscopic illumination with respect to the phase of the elastic wave for each kind of vibration to perform a batch measurement of the displacements, in the off-plane direction of the surface, of the points within the measurement area at least at three different phases of the elastic wave, using speckle interferometry or speckle-shearing interferometry.