Automated Defect Type Identification in Elastic Wave Inspection

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Solution Overview

Problem

Existing defect inspection methods require skilled inspectors to visually determine the type of defects from vibration state images, making it difficult for unskilled personnel to accurately identify defects.

Innovation Solution

A defect inspection apparatus and method that includes an excitation unit for elastic waves, a laser irradiation unit for interference light measurement, and a control unit to automatically identify defect types based on the shape and vibration state of detected defects.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If visual inspection is used to determine defect types, then defect type identification can be performed, but it requires skilled inspectors with specialized knowledge making it difficult for unskilled personnel to accurately identify defects

Engineering Contradiction:
Improvedefect type identification accuracyVSAvoidease of defect type determination
Core Design Contradiction:
Measurement precisionVSEase of operation

Solution Approach 1:

The patent replaces the manual visual inspection mechanism with an automated image processing system. The control unit automatically analyzes the spatial distribution image to extract defect shape information and determines defect types, substituting the inspector's visual analysis capability with computational algorithms. This eliminates the need for specialized knowledge while maintaining accurate defect type identification.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The system enables self-service defect type determination by automatically processing the spatial distribution image and extracting defect characteristics. The control unit performs defect type identification without requiring human inspection expertise, allowing the system to serve itself in determining defect types from the captured image data.

Inventive Principle:
Principle #25Self-service

2Ease of operation

If automated image processing is implemented to identify defect types, then ease of operation improves for unskilled inspectors, but device complexity increases due to additional processing requirements

Engineering Contradiction:
Improveease of defect type determinationVSAvoidcomplexity of defect analysis system
Core Design Contradiction:
Ease of operationVSDevice complexity

Solution Approach 1:

The control unit is designed to perform multiple functions: it captures the spatial distribution image, processes the image data, extracts defect shape information, and determines defect types. By consolidating these functions into a single multi-functional control unit, the patent avoids the need for separate dedicated devices for each function, thereby limiting the increase in overall device complexity while achieving automated defect type identification.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables unskilled inspectors to easily determine defect types by automatically analyzing the shape and vibration state of defects, improving defect identification accuracy and reducing the need for specialized knowledge.

Implementation Method 1

a measurement unit configured to cause the laser light reflected at mutually different positions in the measurement area to interfere with each other to acquire interference light and measure the interference light

Methodology Applied
Scientific EffectInterference: Interference

Implementation Method 2

an excitation unit configured to excite elastic waves in an inspection target object

Methodology Applied
Scientific EffectElastic waves: Vibration

Data Source

PatentUS11815493B2Defect inspection apparatus and defect inspection method
Publication Date: 2023.11.14 SHIMADZU CORP
  • US11815493B2 patent drawing
  • US11815493B2 patent drawing
  • US11815493B2 patent drawing

AI summary

A defect inspection apparatus (100) is provided with and an excitation unit (1) for exciting elastic waves, an irradiation unit (2) for emitting laser light, a measurement unit (3) for measuring interference light, and a control unit (4). The control unit is configured to acquire an image (61) representing a vibration state of an inspection target object (7) in a measurement area based on a measurement result of the measurement unit (3), detect a discontinuous portion in a vibration state in the measurement area from the image representing the vibration state as a defect (73), and identify a type of the defect based on at least one of a shape (62) of the detected defect and the vibration state of a defective portion.