Elastic Wave Detection via Thin Connecting Members
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Solution Overview
Problem
Conventional defect detection techniques, such as the acoustic emission method, often fail to detect defects in operational structures without affecting their functionality, especially when dealing with movable members, due to complex system configurations and interference from structural elements.
Innovation Solution
A detection system utilizing a base member with sensors and connecting members of thickness smaller than the elastic wave wavelength, which converts elastic waves into guided waves for accurate source location without directly attaching sensors to test objects, maintaining system simplicity and functionality.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If sensors are directly attached to test objects for defect detection, then measurement precision is improved, but device complexity and interference with test object function increase
Solution Approach 1:
The patent introduces a base member as an intermediary structure that sensors attach to instead of directly attaching to test objects. The base member serves as a mediator that receives elastic waves from test objects through connecting members, enabling defect detection while maintaining test object functionality and reducing system complexity.
Solution Approach 2:
The system segments the detection structure into distinct components: test objects, connecting members, a base member, and sensors. This segmentation allows sensors to be isolated on the base member rather than directly on test objects, reducing interference while maintaining detection capability through the structured connection path.
2Reliability
If conventional acoustic emission methods are used, then defect detection capability is provided, but signal-to-noise ratio is reduced due to structural interference
Solution Approach 1:
The base member acts as an intermediary that isolates sensors from structural interference elements. By routing elastic waves through connecting members to the base member rather than placing sensors directly on test objects, the system filters out harmful structural noise while preserving defect detection signals.
Solution Approach 2:
The patent extracts sensors from the direct test object structure and places them on a separate base member. This extraction removes sensors from the source of structural interference, enabling cleaner signal acquisition while maintaining the ability to detect elastic waves from test object defects.
3Measurement precision
If multiple sensors are used for accurate source location, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The base member serves as a stable intermediary platform that enhances the effectiveness of fewer sensors. By providing a consistent reference frame and direct wave transmission path through connecting members, the base member allows accurate source location with reduced sensor count compared to conventional direct-attachment methods.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate detection of defects with a simpler configuration, reducing the risk of affecting the test objects' functionality and improving signal-to-noise ratio, allowing for precise localization of defects even with fewer sensors.
Implementation Method 1
The plurality of sensors are provided on the base member, and detect an elastic wave from a test object of a plurality of test objects. The elastic wave propagates through a connecting member among a plurality of connecting members that connect the test objects with the base member.
Data Source
AI summary
According to one embodiment, a detection system includes a base member, a plurality of sensors, and one or more processors. The plurality of sensors are provided on the base member, and detect an elastic wave from a test object of a plurality of test objects. The elastic wave propagates through a connecting member among a plurality of connecting members that connect the test objects with the base member. The connecting members each have a thickness smaller than a wavelength of the elastic wave. The one or more processors detect an abnormality of the test objects based on the detected elastic wave.