Electric Connection Device Fixing Component Probe Head Stability
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Solution Overview
Problem
The formation of through-holes in circuit trace-included members reduces routing efficiency and increases manufacturing costs due to lower flexibility in interconnection layout and the need for larger areas or multilayer structures to prevent probe head deflection.
Innovation Solution
An electric connection device with fixing components protruding from the probe head and anchored to the circuit trace-included member, allowing adjustment to prevent probe head deflection without penetrating the circuit trace-included members, thus maintaining routing efficiency.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Stability of the object's composition
If through-holes are formed in circuit trace-included members to allow fixing components to penetrate, then probe head deflection is minimized, but routing efficiency decreases and manufacturing cost increases
Solution Approach 1:
The fixing component is divided into two separate parts: a fixing portion attached to the probe head and a supporting portion attached to the circuit trace-included member. This segmentation eliminates the need for through-holes while maintaining structural stability, as each part is independently fixed to its respective component.
Solution Approach 2:
The fixing component acts as an intermediary element between the probe head and the circuit trace-included member. By using this intermediate component with distinct fixing and supporting portions, the patent achieves stable connection without penetrating the circuit trace-included member, thus preserving routing efficiency.
2Stability of the object's composition
If through-holes are formed in circuit trace-included members, then probe head deflection is minimized, but manufacturing cost increases due to larger area or multilayer structures required
Solution Approach 1:
The fixing component is segmented into a fixing portion and a supporting portion, allowing independent optimization of each part's function. This eliminates the need for complex through-hole structures or multilayer designs, simplifying manufacturing while maintaining stability.
Solution Approach 2:
Instead of penetrating the circuit trace-included member with a single through-hole fixing component, the patent inverts the approach by using a supporting portion that attaches to the circuit trace-included member from one side, eliminating the need for through-holes and reducing manufacturing complexity.
3Stability of the object's composition
If fixing components penetrate circuit trace-included members, then probe head deflection is prevented, but regions where traces cannot be arranged increase
Solution Approach 1:
The patent inverts the traditional fixing approach by having the supporting portion of the fixing component attach to the circuit trace-included member without penetration. This eliminates the need for through-holes and their associated keep-out zones, maximizing the area available for trace arrangement.
Solution Approach 2:
The fixing component is designed with localized functionality: the fixing portion attaches to the probe head while the supporting portion attaches to the circuit trace-included member. This local differentiation allows stable fixation without creating large non-traceable regions, as the supporting portion can be positioned to minimize impact on trace routing.
Data Source
AI summary
An electric connection device, includes: a circuit trace-included member (30); a probe (10) including a base that connects to a circuit trace formed in the circuit trace-included member (30) and a tip that comes into contact with an inspection subject (2); a probe head (20) which is provided next to the circuit trace-included member (30) and holds the probe (10); and a fixing component (100) which is located in the probe head (20) with an end protruding from the probe head (20) toward the circuit trace-included member (30), the end being fixed to a fixing surface (301) of the circuit trace-included member (30) that faces the probe head (20) to connect the probe head (20) and the circuit trace-included member (30).


