Electrical Property Imaging Using Optical Boundary Detection
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Solution Overview
Problem
Current electrical property imaging techniques require excessive computation time and initial estimates based on CT or MRI images, limiting their accuracy and efficiency in producing high-resolution images of electrical properties in objects like the human breast.
Innovation Solution
An apparatus and method that detects the object's outer boundary using optical sources and sensors, allowing for electrical property imaging without prior knowledge of internal structures, using arrays of sensors to locate anomalies and measure their size and properties directly, without the need for separate tomographic images.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional electrical property imaging techniques are used, then initial estimates based on CT or MRI images can be obtained, but excessive computation time is required and prior knowledge of internal structures is needed
Solution Approach 1:
The patent extracts and removes the requirement for initial estimates from the imaging process. By using a finite difference formulation that directly solves for electrical properties from boundary measurements, the method eliminates the need for preliminary CT or MRI images and iterative reconstruction algorithms, thereby reducing computation time while maintaining accuracy.
Solution Approach 2:
The patent performs preliminary action by pre-calculating and storing the relationship between boundary conditions and internal electrical properties in lookup tables. This allows the imaging process to quickly retrieve pre-computed solutions without performing excessive computations during actual imaging, thus reducing real-time computation time while preserving measurement precision.
2Measurement precision
If conventional electrical property imaging techniques are used, then initial estimates based on CT or MRI images are required, but this increases device complexity and procedure time
Solution Approach 1:
The patent removes the dependency on external CT or MRI imaging systems by extracting only the essential boundary measurement data needed for electrical property reconstruction. This standalone approach eliminates the complexity of integrating multiple imaging modalities while maintaining accurate electrical property imaging through direct boundary value problem solving.
3Measurement precision
If optical sources and sensors are used to detect the object's outer boundary, then accurate localization of internal anomalies is achieved, but additional hardware is required
Solution Approach 1:
The patent makes the optical measurement system multi-functional by using the same optical sources and sensors for both boundary detection and internal anomaly localization. The boundary information obtained serves as input for the electrical property reconstruction, eliminating the need for separate dedicated hardware while achieving accurate anomaly localization through the integrated measurement approach.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables accurate imaging of electrical properties with reduced computation time and without initial estimates, effectively locating and measuring internal anomalies like tumors in the breast, improving detection and tracking during radiation treatment.
Implementation Method 1
detects the object's outer boundary using arrays of optical sources and sensors
Implementation Method 2
using arrays of sensors to locate anomalies and measure their size and properties directly
Data Source
AI summary
An electrical parameter imaging apparatus and method includes the acquisition of a charge distribution pattern on an array of electrodes that surround an object being imaged. In addition the exterior boundary, or contours of the object is measured by an array of light beams and associated light sensors. The contour measurement is employed to provide a first estimate of the object geometry needed to compute an electrical parameter image from the acquired charge distribution pattern.