Electrical Probe Alignment for Transparent Substrates
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Solution Overview
Problem
Conventional methods struggle to align patterns on substrates with transparent materials, as they lack effective optical contrast, making optical alignment difficult or impossible, particularly in multi-layer articles like touch-screens and photovoltaic devices.
Innovation Solution
A system that uses electrical measurements to identify the location of alignment structures on transparent substrates by measuring resistivity differences, allowing for precise alignment of subsequent patterns based on these electrical characteristics.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If optical alignment methods are used to locate alignment structures, then alignment precision can be achieved for opaque materials, but the method becomes ineffective or impossible when applied to transparent substrates lacking optical contrast
Solution Approach 1:
The patent replaces the optical measurement system with an electrical measurement system. Instead of using cameras or optical sensors to detect alignment structures, the system uses electrical probes to measure electrical characteristics (such as resistance or capacitance) at different positions on the substrate. The alignment structure has a different electrical characteristic than the substrate, allowing its location to be identified through electrical measurements, thereby enabling alignment on transparent substrates where optical methods fail.
2Adaptability or versatility
If electrical measurements are used to identify alignment structure locations, then alignment becomes possible on transparent substrates, but the measurement system becomes more complex compared to optical methods
Solution Approach 1:
The electrical probe system is designed to perform multiple functions: it measures electrical characteristics to locate alignment structures, and the same system can potentially measure other electrical properties of the substrate. The controller integrates various measurement modes and data processing functions into a single unified system, reducing overall complexity despite the advanced measurement capabilities required for transparent substrates.
3Measurement precision
If alignment structures are formed with different electrical characteristics than the substrate, then electrical measurement can identify their locations, but the manufacturing process becomes more complex
Solution Approach 1:
The patent combines the alignment structure formation with the functional pattern formation in a single manufacturing step. The alignment structures are created as integral parts of the functional patterns during the same deposition or printing process, rather than as separate additional steps. This merging of functions reduces manufacturing complexity while maintaining the electrical contrast necessary for precise location identification.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate alignment of patterns on transparent substrates, even when optical contrast is absent, improving the registration of multi-layer articles and expanding applications to include touch-screens and photovoltaic devices.
Implementation Method 1
A probe measures an electrical characteristic, such as resistivity, at each of a plurality of positions proximate the substrate
Data Source
AI summary
A system for forming a second pattern in registration with a first pattern on a substrate is disclosed. The system comprises the substrate having a first magnitude of an associated electrical characteristic and at least one alignment structure. The alignment structure has a second magnitude of the electrical characteristic different from that of the substrate. An advancing mechanism is used for moving the substrate. A probe is used for measuring an electrical characteristic at a plurality of positions proximate the moving substrate. A controller is used for interpreting the measured electrical characteristic as a function of position for identifying a location of the alignment structure. A first patterning station is used for forming the second pattern on a surface of the substrate in registration with the first pattern based on the identified location of the alignment structure.