Electrical Probe with Angled Pins for High-Current Testing

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Solution Overview

Problem

Existing electrical probes face challenges in accurately measuring high current flow due to heat generation and limited contacting area, particularly when dealing with high-resistance films covering test objects like semiconductor chips or battery electrodes, which can lead to incorrect electrical properties tests.

Innovation Solution

The electrical probe design includes a main body, a probe head with through holes and openings, and pins with obtuse and acute angles, allowing the pins to penetrate and remove high-resistance films, ensuring a low resistance contact with the test object, thereby increasing the contact area and preventing incorrect test results.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If the electrical probe directly contacts the surface of the product to measure electrical properties, then the measurement accuracy is improved, but heat generation increases and contacting area is limited

Engineering Contradiction:

Improveelectrical properties measurement accuracyVSAvoidheat generation

Core Design Contradiction:

Measurement precisionVSTemperature

Solution Approach 1:

The probe head is divided into multiple pins (at least two pins) that can be independently inserted into openings on the product surface. Each pin makes contact at a separate location, distributing the contact area and reducing heat concentration at any single point while maintaining accurate electrical measurements across multiple contact points.

Inventive Principle:

Principle #1Segmentation

2Measurement precision

If the electrical probe directly contacts the surface of the product, then measurement accuracy is improved, but contacting area is limited

Engineering Contradiction:

Improveelectrical properties measurement accuracyVSAvoidcontacting area

Core Design Contradiction:

Measurement precisionVSArea of stationary object

Solution Approach 1:

The probe design transitions from surface contact to subsurface contact by inserting pins through openings into the product interior. This dimensional change allows contact points to be positioned below the surface film layer, effectively increasing the functional contacting area while maintaining measurement precision through multiple insertion points distributed across the product surface.

Inventive Principle:

Principle #17Another dimension (Dimensionality change)

3Reliability

If high-resistance films cover the test object surface, then electrical isolation is improved, but electrical contact is blocked

Engineering Contradiction:

Improveelectrical isolationVSAvoidelectrical contact quality

Core Design Contradiction:

ReliabilityVSMeasurement precision

Solution Approach 1:

The pin insertion process performs a preliminary action by mechanically penetrating through the high-resistance film layer before electrical contact is established. This preliminary mechanical action removes or breaches the insulating film barrier, enabling subsequent reliable electrical contact with the underlying conductive elements while the film remains intact for electrical isolation during normal operation.

Inventive Principle:

Principle #10Preliminary action

Data Source

PatentUS10254310B2Electrical probe with a probe head and contacting pins

Publication Date: 2019.04.09 CHROMA ATE INC

AI summary

An electrical probe includes a main body, a probe head and a plurality of pins. The probe head is disposed on the main body, and the probe head has a surface and a plurality of openings on the surface. Each pin includes a contacting portion and an inserting portion connected to each other. Each pin has an obtuse angle between the contacting portion and the inserting portion, and the inserting portions of the pins respectively inserted into the openings.