Electro-optical Device Selection Signal Wiring Inspection
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Solution Overview
Problem
In electro-optical devices with a demultiplexer scheme, it is difficult to simultaneously supply a selection signal to all selection signal supply wirings for analysis, as multiple probes are required, which are restricted in size and can obstruct the display region, making it challenging to inspect failures like short-circuited locations between data lines and capacitor lines.
Innovation Solution
The electro-optical device incorporates a resistance member to electrically couple adjacent selection signal supply wirings, allowing a single probe to supply a selection signal to multiple wirings, reducing the number of probes needed and preventing obstruction of the display region during inspection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If multiple probes are used to supply selection signals to all selection signal supply wirings simultaneously, then all data lines can be inspected at the same time, but the probes obstruct the display region and are restricted in number due to their large size
Solution Approach 1:
The patent electrically couples adjacent selection signal supply wirings together, allowing a single probe to supply selection signals to multiple wirings simultaneously. This merging approach enables all data lines to be inspected at once without requiring multiple physical probes, thereby eliminating the obstruction problem while maintaining high inspection efficiency
2Object-affected harmful factors
If a single probe is used to supply selection signals, then the display region is not obstructed, but only one selection signal wiring can be supplied with a selection signal at a time
Solution Approach 1:
The patent makes a single probe capable of supplying selection signals to multiple selection signal supply wirings simultaneously by electrically coupling these wirings together. This multi-functionality allows one probe to perform the work of multiple probes, eliminating obstruction while maintaining inspection efficiency
3Reliability
If all selection signal supply wirings are supplied with selection signals simultaneously for analysis, then all data lines can be energized for comprehensive inspection, but multiple probes are required which are restricted in use
Solution Approach 1:
The patent merges multiple selection signal supply wirings into electrically coupled groups, allowing a single probe to energize all data lines simultaneously through the coupled wirings. This approach achieves comprehensive failure detection capability while reducing the probe requirement to just one, simplifying the inspection device
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration enables efficient inspection of data lines and capacitor lines by allowing a single probe to supply a selection signal to multiple selection signal supply wirings, improving the ability to detect failures without obstructing the display region, thus enhancing the inspection process and yield ratio.
Implementation Method 1
a resistance member for electrically coupling the selection signal supply wirings adjacent to each other
Data Source
AI summary
A first substrate of an electro-optical device includes a data line, a switching element of a demultiplexer, which is provided corresponding to the data line, and a selection signal supply wiring configured to supply a selection signal for selecting one data line, among a plurality of the data lines grouped into blocks, to the switching element. The first substrate also includes a resistance member for electrically connecting the selection signal supply wirings adjacent to each other. Thus, all of the selection signal supply wirings can be supplied with a selection signal for analysis, when a probe is brought into contact with an inspection terminal.