Electrode Coating Inspection Using Brightness Histogram Overlap Detection

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Solution Overview

Problem

Existing methods fail to accurately inspect the coating state of insulation materials on electrodes in secondary batteries, leading to potential short circuits due to inadequate coverage, which can be exacerbated by temperature changes.

Innovation Solution

A system and apparatus using a brightness distribution estimation model, such as a Gaussian mixture model, to analyze the coating state by generating a brightness histogram from inspection images, identifying overlapping sections of electrode active and insulation materials, and determining coating defects based on reference points and width measurements.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If traditional inspection methods are used to check coating state, then the inspection process is simple, but the accuracy in estimation of overlapping section is insufficient

Engineering Contradiction:
Improveaccuracy in estimation of overlapping sectionVSAvoidcomplexity of inspection system
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent replaces traditional mechanical/optical inspection methods with a computational approach using brightness distribution estimation models. The system captures images of the coating and uses image processing algorithms to generate brightness histograms, which are then analyzed by trained models to estimate overlapping sections accurately. This substitution of mechanical inspection with computational analysis resolves the contradiction by achieving high measurement precision through software-based methods rather than complex hardware modifications.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent transforms the inspection problem from direct visual assessment to analysis of brightness distribution parameters. By converting image data into brightness histograms and analyzing statistical parameters (mean, standard deviation, skewness, kurtosis) of the brightness distribution, the system achieves accurate estimation of overlapping sections. This parameter transformation approach allows precise measurement without increasing physical device complexity.

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If multiple inspection methods are combined to improve coating inspection accuracy, then the measurement precision improves, but the device complexity increases

Engineering Contradiction:
Improvemeasurement precision of coating stateVSAvoidcomplexity of inspection apparatus
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent creates a universal inspection system that can handle multiple coating inspection tasks through a single integrated platform. The brightness distribution estimation model serves multiple functions: it can inspect different types of coatings, analyze various overlapping patterns, and adapt to different base plate configurations. This multi-functionality approach allows the system to achieve high measurement precision across diverse applications without proportionally increasing device complexity, as one versatile system replaces what would otherwise require multiple specialized inspection devices.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Measurement precision

If image processing algorithms are used to analyze coating brightness distribution, then the estimation accuracy of overlapping sections improves, but the quality uniformity of captured images becomes more critical

Engineering Contradiction:
Improveestimation accuracy of overlapping sectionVSAvoidquality uniformity for captured image
Core Design Contradiction:
Measurement precisionVSManufacturing precision

Solution Approach 1:

The patent incorporates feedback mechanisms in the form of brightness distribution analysis. By examining the statistical characteristics of brightness distribution across the image, the system can identify variations in image quality and compensate for them through the estimation algorithm. The feedback from brightness histogram analysis allows the system to maintain accurate overlapping section estimation even when there are minor variations in image capture quality, thus resolving the contradiction between estimation accuracy and image quality uniformity requirements.

Inventive Principle:
Principle #23Feedback

Data Source

PatentEP4625319A1System and apparatus for inspecting coating state and an operation method thereof
Publication Date: 2025.10.01 SK ON CO LTD
  • EP4625319A1 patent drawingFigure 1~2A
  • EP4625319A1 patent drawingFigure 2B~3A
  • EP4625319A1 patent drawingFigure 3B

AI summary

The present disclosure relates to a system and apparatus for inspecting a coating state and an operation method thereof. The operation method of the apparatus for inspecting a coating state according to an embodiment of the present disclosure may include: using a photographing module, photographing at least a partial area of a base plate which comprises a first area coated with a first material and a second area not coated with the first material, wherein a partial area of the first material and a partial area of the second area 31b are coated with a second material, to obtain an inspection image; generating a brightness histogram related to a brightness of the inspection image based on a pre-trained brightness distribution estimation model; and estimating an overlapping section where the second material and the first material are overlapped based on the generated brightness histogram.