Electrode Assembly Inspection with Adjustable Lighting Geometry

The patent uses 2D vision equipment to capture images of electrode tabs, creating a simplified optical copy of the inspection target. Instead of using complex 3D vision or X-ray equipment, the system captures 2D images that are then processed to detect defects, omissions, and shape issues. This copying approach maintains sufficient measurement precision while dramatically reducing device complexity and cost.

The patent replaces expensive, complex inspection equipment (X-ray generators and 3D vision systems) with cheaper 2D vision equipment. The 2D cameras and lighting systems are more affordable and simpler to implement, achieving comparable inspection effectiveness without the high cost and complexity of advanced imaging systems.

The patent substitutes expensive X-ray equipment with affordable 2D vision systems. The 2D cameras, LED lighting, and image processing software provide a cost-effective alternative that achieves the same inspection objectives. This replacement dramatically reduces the manufacturing cost of the inspection system while maintaining adequate measurement precision for detecting electrode tab defects.

The system creates 2D image copies of the electrode tabs using inexpensive cameras, eliminating the need for costly X-ray imaging. These 2D images are then processed through image analysis algorithms to extract defect information, providing a low-cost pathway to achieving reliable inspection accuracy.

The patent optimizes the lighting system with multiple light sources positioned at specific angles and locations to illuminate different regions of the electrode tabs. This localized lighting approach ensures that each area of interest receives appropriate illumination, enhancing the quality of 2D images for defect detection. The lighting configuration compensates for the limitations of 2D vision by creating optimal contrast and visibility for various defect types.

The patent employs adjustable lighting systems that can dynamically adapt illumination angles and intensities based on the inspection requirements. The lighting holder and light sources can be positioned and adjusted to optimize image quality for different inspection scenarios, allowing the 2D system to achieve measurement precision comparable to 3D systems through dynamic optimization of imaging conditions.