Electrode Film Notching Cleanup With Image-Guided Particle Removal
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Solution Overview
Problem
Existing foreign material removal processes for secondary batteries fail to effectively remove foreign substances attached to electrode films, leading to potential short circuit failures.
Innovation Solution
A foreign material removal device that photographs the upper and lower surfaces of the electrode pattern during the notching process, calculates the position of foreign materials, and applies targeted air spraying and vacuum suction to specific areas where foreign materials are detected.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If conventional foreign material removal process is used, then the entire electrode film surface is treated, but foreign material is not effectively removed and cleaning efficiency is low
Solution Approach 1:
The patent applies local quality by transitioning from uniform full-surface cleaning to position-specific targeted cleaning. The cleaning unit is controlled to apply cleaning force only to areas where foreign material is detected, as determined by the imaging system. This localized approach improves removal effectiveness while reducing overall cleaning time and resource consumption.
Solution Approach 2:
The patent implements preliminary action by using the imaging system to detect and map foreign material positions before the cleaning process begins. This pre-detection step allows the cleaning unit to be precisely positioned and controlled to address only the identified contamination areas, avoiding unnecessary cleaning of clean regions and thereby improving both effectiveness and efficiency.
2Reliability
If conventional foreign material removal process is used, then cleaning is performed on entire surface, but foreign material position is not confirmed and removal is incomplete
Solution Approach 1:
The patent applies feedback by establishing a closed-loop system where the imaging system continuously monitors foreign material positions, and this information is fed back to control the cleaning unit's movements and actions. The cleaning process is dynamically adjusted based on real-time detection data, ensuring complete removal while maintaining a manageable control system through automated feedback mechanisms.
Solution Approach 2:
The patent replaces manual or uniform mechanical cleaning with an automated, image-guided cleaning system. The imaging system optically detects foreign material positions, and this information automatically controls the cleaning unit's positioning and operation, substituting mechanical guesswork with precision optical detection and automated control.
3Productivity
If targeted cleaning is applied, then cleaning time is reduced, but detection precision is required
Solution Approach 1:
The patent introduces an imaging system as an intermediary between the electrode film surface and the cleaning unit. This intermediary captures optical images to precisely identify foreign material positions, translating visual information into control signals that guide the cleaning unit. The intermediary enables high-speed operation by providing accurate positional data without requiring direct mechanical scanning or trial-and-error cleaning.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Improves foreign material removal efficiency by intensively cleaning only the areas with foreign substances, reducing the risk of short circuits and enhancing the overall cleaning process.
Implementation Method 1
air is sprayed to the position of the foreign material
Implementation Method 2
a vacuum pressure is applied thereto according to the foreign material position information
Data Source
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AI summary
It is preferred that the foreign material removal device for notching a secondary battery according to one example of the present invention comprises: a foreign material confirmation part provided so that in a transport path of an electrode film through a notching process, the upper and lower surfaces of the notched electrode pattern are photographed, and a position of a foreign material present in the electrode pattern is calculated based on the photographed image; and a foreign material removal process part provided so that air is sprayed to the position of the foreign material and a vacuum pressure is applied thereto according to the foreign material position information calculated by the foreign material confirmation part.