Electrode Sheet Stack X-Ray Alignment Measurement
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Solution Overview
Problem
Existing methods for determining the placement accuracy of electrode sheets in a stack, such as computed tomography, are expensive and do not allow direct measurement of the relative positions of the electrode sheets, while two-dimensional X-ray imaging methods fail to accurately correlate the edges of the sheets with individual sheets.
Innovation Solution
A method using a two-dimensionally resolving X-ray system with a beam source and detector to irradiate the stack from multiple spatial coordinates, generating and evaluating contours to determine the positions of the electrode sheets' edges through linear equations and potentially aided by a convolutional neural network (CNN) for precise alignment.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If computed tomography is used to determine placement accuracy, then measurement precision is improved, but device complexity and cost increase
Solution Approach 1:
The patent divides the three-dimensional measurement task into multiple two-dimensional X-ray measurements taken from different spatial coordinates. By segmenting the measurement process into discrete 2D projections that are later reconstructed computationally, the system achieves 3D placement accuracy without requiring a complex 3D CT scanner, thus reducing device complexity while maintaining measurement precision.
Solution Approach 2:
The patent introduces computational algorithms as an intermediary between the simple 2D X-ray measurements and the final 3D placement accuracy determination. Instead of using complex 3D imaging hardware, the system uses software-based reconstruction methods to derive three-dimensional position information from multiple two-dimensional projections, effectively substituting hardware complexity with computational processing.
2Measurement precision
If computed tomography is used to determine placement accuracy, then measurement precision is improved, but productivity decreases due to lengthy measurement time
Solution Approach 1:
The patent employs periodic action by taking multiple discrete 2D X-ray measurements at different spatial coordinates in sequence, rather than performing a continuous lengthy 3D CT scan. Each 2D measurement is quickly acquired, and the series of measurements are subsequently processed to determine 3D placement accuracy, thereby reducing total measurement time while maintaining precision.
Solution Approach 2:
The patent uses partial action by acquiring only the necessary 2D projections from strategically selected spatial coordinates rather than performing a complete 360-degree CT scan. This selective measurement approach reduces the total measurement time and radiation exposure while still providing sufficient data for accurate 3D placement determination through computational reconstruction.
3Ease of manufacture
If two-dimensional X-ray imaging is used, then cost is reduced, but measurement capability deteriorates as direct position measurement becomes impossible
Solution Approach 1:
The patent compensates for the limitation of 2D imaging by introducing multiple spatial coordinates as additional dimensions. Instead of attempting to measure 3D positions directly with a single 2D image, the system captures multiple 2D projections from different angles and positions, then uses computational methods to reconstruct the three-dimensional edge positions, effectively adding dimensional information through multiple measurements rather than through hardware complexity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate determination of electrode sheet positions within a stack, reducing the need for full measurement of all sheets and allowing for efficient quality control in battery cell production by identifying deviations and adjusting manufacturing processes.
Implementation Method 1
A method is proposed using a measuring device with a two-dimensionally resolving X-ray system with at least one beam source for X-rays and a detector
Data Source
AI summary
A method for determining the placement accuracy of a plurality of electrode sheets, wherein the electrode sheets extend on mutually parallel planes and are stacked on top of one another and form a stack; wherein the placement accuracy describes positions of the edges of all of the electrode sheets relative to one another in the stack; wherein the method is carried out using a measuring device having a two-dimensionally resolving X-ray system with at least one beam source for X-ray radiation and a detector.