Electrode Stack Edge Positioning via Multi-Angle 2D X-Ray

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Solution Overview

Problem

Existing methods for determining the accuracy of electrode leaf positions in a stack, such as computer tomography, are expensive and not suitable for real-time production, while cheaper two-dimensional X-ray systems cannot directly measure the position of electrode leaves relative to each other.

Innovation Solution

A procedure using a two-dimensional X-ray system with at least one X-ray source and a detector to capture multiple contours of the electrode leaves from different angles, allowing for the evaluation and determination of the positions of the edges of the electrode leaves.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If computed tomography is used to determine positioning accuracy, then measurement precision is improved, but device cost increases significantly

Engineering Contradiction:
Improvepositioning accuracyVSAvoiddevice cost
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The three-dimensional measurement problem is segmented into multiple two-dimensional measurements taken from different spatial coordinates. By capturing contours from multiple angles and combining them through evaluation, the system achieves accurate positioning determination using simpler, less expensive two-dimensional X-ray systems rather than requiring complex computed tomography equipment.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent transitions from two-dimensional contour measurements to three-dimensional positioning information by taking measurements from multiple spatial coordinates. The contours captured from different angles are evaluated together to reconstruct and determine the three-dimensional positions of electrode sheet edges, effectively using dimensional transformation to achieve CT-level precision with simpler equipment.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Device complexity

If two-dimensional X-ray systems are used, then device cost is reduced, but measurement precision deteriorates because direct measurement of relative positions is not possible

Engineering Contradiction:
Improvedevice costVSAvoidpositioning accuracy
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

Multiple contour measurements are taken from different spatial coordinates before evaluation. By capturing all necessary two-dimensional contour data from various angles in advance, the system prepares sufficient information that can be later processed to determine three-dimensional positions, enabling accurate measurement with cost-effective two-dimensional equipment.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent introduces an evaluation process that acts as an intermediary between multiple two-dimensional contour measurements and the final three-dimensional positioning result. This evaluation step combines the contour information from different spatial coordinates to reconstruct edge positions, serving as a computational mediator that bridges the gap between simple 2D measurements and accurate 3D positioning.

Inventive Principle:
Principle #24Intermediary (Mediator)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables accurate determination of electrode leaf positions within a stack, allowing for the assignment of deviations to specific electrode leaves, thereby improving the quality control of battery cell production without the need for expensive equipment.

Implementation Method 1

Irradiating the stack with the at least one beam source from a first spatial coordinate, wherein the beam direction is at least transverse to the planes and towards the detector, wherein a beam from the beam source detects the stacked edges of the electrode sheets

Methodology Applied
Scientific EffectX-ray detection: X-Ray

Data Source

PatentEP4113107B1Method for determining a deposit accuracy of a plurality of electrode sheets in a stack
Publication Date: 2025.04.16 POWERCO SE
  • EP4113107B1 patent drawingFigure 1
  • EP4113107B1 patent drawingFigure 2
  • EP4113107B1 patent drawingFigure 3~5

AI summary

Method for determining the placement accuracy of a plurality of electrode sheets (1, 2, 3), wherein the electrode sheets (1, 2, 3) extend in mutually parallel planes (4) and are arranged stacked on top of each other, forming a stack (5); wherein the placement accuracy describes the positions (6, 7, 8) of the edges (9) of all electrode sheets (1, 2, 3) relative to each other in the stack (5); wherein the method is carried out with a measuring device (10) comprising a two-dimensionally resolving X-ray system (11) with at least one X-ray source (12) and a detector (13).