Electrolyte Detection for Void-Free Conductive Layers

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Solution Overview

Problem

The electroplating process in semiconductor manufacturing is hindered by variations in the plating solution, leading to reduced quality and reliability of the conductive layers due to contaminants and changes in chemical composition, which affect the electrical performance of semiconductor devices.

Innovation Solution

An electrolyte detecting and analysis method using voltammetry measurement technology with metal probes is employed to monitor the chemical composition and concentration of the electrolyte solution in real-time, ensuring specific concentrations are maintained by adding or replacing the electrolyte solution as needed, thereby controlling plating characteristics and preventing voids or contamination.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If the electroplating process is performed using conventional monitoring methods, then the manufacturing process can proceed, but the quality and reliability of the conductive layer deteriorate due to variations in plating solution composition

Engineering Contradiction:
Improvequality of conductive layerVSAvoidchemical composition of plating solution
Core Design Contradiction:
Manufacturing precisionVSStability of the object's composition

Solution Approach 1:

The patent implements real-time monitoring of plating solution composition using a detection device that measures chemical parameters and provides feedback signals. This feedback mechanism allows for continuous adjustment and control of the electroplating process, ensuring consistent conductive layer quality by detecting and responding to changes in plating solution composition during the manufacturing process.

Inventive Principle:
Principle #23Feedback

2Reliability

If real-time monitoring of electrolyte solution is implemented, then the quality and reliability of electroplating is improved, but the device complexity increases due to additional detection and analysis equipment

Engineering Contradiction:
Improvereliability of electroplating processVSAvoidcomplexity of detection system
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent introduces a detection device as an intermediary between the plating solution and the control system. This intermediary device measures chemical parameters of the electrolyte solution and converts them into detectable signals, enabling indirect monitoring of solution composition without directly interfering with the electroplating process. This approach improves reliability while managing device complexity through the use of a specialized intermediary tool.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Manufacturing precision

If conventional electroplating monitoring is used, then the process is simpler to operate, but contaminants and chemical variations go undetected, reducing electrical performance

Engineering Contradiction:
Improveelectrical performance of semiconductor deviceVSAvoiddetection of contaminants and chemical composition
Core Design Contradiction:
Manufacturing precisionVSDifficulty of detecting and measuring

Solution Approach 1:

The patent replaces conventional mechanical or visual inspection methods with electrochemical detection techniques. The detection device uses electrochemical principles to measure and identify contaminants and chemical composition changes in the plating solution, providing sensitive and specific detection that surpasses traditional mechanical monitoring approaches. This substitution enables accurate detection of electrical performance-affecting factors.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enhances the quality and reliability of the electroplating process, ensuring a void-free conductive layer and improved uniformity, which in turn increases circuit performance and reliability of semiconductor devices.

Implementation Method 1

An electrolyte detecting and analysis method using voltammetry measurement technology with metal probes is employed to monitor the chemical composition and concentration of the electrolyte solution

Methodology Applied
Scientific EffectVoltammetry:

Implementation Method 2

an electroplating process includes depositing or plating out positively charged ions (such as metal ions) onto a negatively charged substrate (such as the semiconductor wafer)

Methodology Applied
Scientific EffectElectroplating: Electroplating

Data Source

PatentUS10345254B2Detection method for electroplating process
Publication Date: 2019.07.09 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US10345254B2 patent drawing
  • US10345254B2 patent drawing
  • US10345254B2 patent drawing

AI summary

Detection methods for an electroplating process are provided. A detection method includes immersing a substrate into an electrolyte solution to perform an electroplating process. The electrolyte solution includes an additive agent. The detection method also includes immersing a detection device into the electrolyte solution. The detection method further includes applying a first alternating current (AC) voltage or direct current (DC) voltage to the detection device to detect the concentration of the additive agent. In addition, the detection method includes applying a combination of a second AC voltage and a second DC voltage to the detection device to inspect the electrolyte solution. An impurity is detected in the electrolyte solution. The detection method also includes replacing the electrolyte solution containing the impurity with another electrolyte solution.