Electromagnetic Wave Detection Using Scheimpflug Alignment

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Solution Overview

Problem

Current electromagnetic wave detection systems face challenges in improving image resolution, particularly in the angle-of-view range away from the main axis, where resolution is lower compared to the main axis neighborhood.

Innovation Solution

The electromagnetic wave detection apparatus incorporates a travel unit with a reference surface of pixels that can switch the direction of incident electromagnetic waves, a second image formation unit, and detectors arranged to satisfy the Scheimpflug principle, allowing for improved image resolution by focusing on the main axis neighborhood of the secondary image formation optical system.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a conventional image formation system is used with parallel surfaces, then the structure is simple, but the resolution in the angle-of-view range away from the main axis is lower

Engineering Contradiction:
Improveimage resolutionVSAvoidoptical system arrangement
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent applies the Scheimpflug principle by making the image surface, lens plane, and detector surface intersect along a common axis rather than being parallel. This dimensional rearrangement allows the entire angle-of-view range to be imaged with high resolution on the detector surface, resolving the contradiction between maintaining simple structure and achieving uniform high resolution across all viewing angles.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Area of stationary object

If the detection surface is positioned to capture the full angle-of-view range, then the coverage area is increased, but the resolution away from the main axis deteriorates

Engineering Contradiction:
Improvedetection coverage areaVSAvoidresolution in angle-of-view range
Core Design Contradiction:
Area of stationary objectVSMeasurement precision

Solution Approach 1:

By arranging the detector surface, lens main surface, and image surface to intersect along a common axis according to the Scheimpflug principle, the patent achieves both full angle-of-view coverage and uniform high resolution across the entire detection area, eliminating the trade-off between coverage area and resolution.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Device complexity

If the main axis of the second image formation unit is aligned perpendicular to the reference surface, then the optical path is simplified, but the image quality in the angle-of-view range away from the main axis is reduced

Engineering Contradiction:
Improveoptical path arrangementVSAvoidimage quality
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The patent tilts the detector surface and image surface relative to the reference surface so that they intersect along a common axis with the lens main surface. This angular arrangement optimizes the optical path to achieve high image quality across the entire angle-of-view range while maintaining reasonable structural simplicity.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration enhances the resolution of detected electromagnetic waves by aligning the reference surface, image formation units, and detectors to ensure that images formed in the main axis neighborhood are accurately captured within the detection surface, improving overall image quality.

Implementation Method 1

a first image formation unit (15), and configured to form an image of incident electromagnetic waves

Methodology Applied
Scientific EffectImage formation by optical system: Lens

Implementation Method 2

configured to switch a traveling direction of incident electromagnetic waves for each pixel, and configured to cause electromagnetic waves incident on the reference surface from the first image formation unit to travel in a first direction for each of the plurality of pixels

Methodology Applied
Scientific EffectElectromagnetic wave direction switching: Reflection

Implementation Method 3

a second image formation unit (19), and configured to form an image of electromagnetic waves traveling in the first direction

Methodology Applied
Scientific EffectImage formation by optical system: Lens

Implementation Method 4

a first detector (20), and configured to detect electromagnetic waves incident from the second image formation unit

Methodology Applied
Scientific EffectElectromagnetic wave detection: Photoelectric Effect

Data Source

PatentUS11573316B2Electromagnetic wave detection apparatus and information acquisition system
Publication Date: 2023.02.07 KYOCERA CORP
  • US11573316B2 patent drawing
  • US11573316B2 patent drawing
  • US11573316B2 patent drawing

AI summary

An electromagnetic wave detection apparatus comprises a first image formation unit, a travel unit 18, a second image formation unit, and a first detector. The travel unit 18 includes a plurality of pixels px arranged along a reference surface. The electromagnetic wave detection apparatus has at least one of: an arrangement in which respective extension surfaces of the reference surface and a detection surface of the first detector intersect each other and a main axis of the second image formation unit intersects the reference surface and the detection surface of the first detector; and an arrangement in which respective extension surfaces of the reference surface and an object surface of the first image formation unit whose spacing to the travel unit is set and whose image surface is the reference surface intersect each other and a main axis of the first image formation unit intersects the reference surface.