Electromagnetic-wave detection device with segmented apertures
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Solution Overview
Problem
Existing electromagnetic-wave detection devices face challenges in achieving high spatial resolution and accuracy due to the shared incidence unit for multiple detectors, leading to interference and reduced positional accuracy.
Innovation Solution
The electromagnetic-wave detection device incorporates a radiating unit, incidence unit, first and second detection units, apertures, and a controller, where the first aperture allows wider electromagnetic wave passage for the first detection unit and the second aperture filters waves for the second detection unit, enabling separate optical characteristics for each detector and improving positional accuracy.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If a shared incidence unit is used for multiple detectors, then device complexity is reduced, but measurement precision and positional accuracy deteriorate due to interference between detectors
Solution Approach 1:
The patent divides the single shared incidence unit into multiple separate incidence units (first incidence unit and second incidence unit), each dedicated to a specific detector. This segmentation eliminates interference between detectors while maintaining structural organization, thereby improving measurement precision without excessive complexity increase.
Solution Approach 2:
The patent assigns different optical characteristics to different incidence units tailored to their specific detection purposes. The first incidence unit is optimized for reflected wave detection while the second is optimized for electromagnetic wave detection, allowing each component to have local quality optimized for its function, improving overall measurement precision.
2Device complexity
If a single aperture is used for both detectors, then device complexity is reduced, but measurement precision deteriorates due to inability to optimize optical characteristics for each detector
Solution Approach 1:
The patent divides the single aperture into multiple separate apertures (first aperture and second aperture), each dedicated to a specific detection path. This allows optimization of optical characteristics for each detector without compromising the other, improving measurement precision while maintaining manageable device complexity.
Solution Approach 2:
Each aperture is designed with specific optical characteristics optimized for its corresponding detector. The first aperture is optimized for reflected wave transmission to the first detector, while the second aperture is optimized for electromagnetic wave transmission to the second detector, enabling local quality optimization for each detection function.
3Adaptability or versatility
If electromagnetic waves from all directions are allowed to pass through the aperture, then detection coverage is improved, but measurement precision deteriorates due to noise from unwanted directions
Solution Approach 1:
The patent implements direction-specific transmission characteristics in the aperture design, where different regions of the aperture allow transmission from different directions. This enables the system to maintain broad detection coverage while selectively admitting signals from desired directions and blocking noise from unwanted directions, thereby improving signal-to-noise ratio.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration enhances the positional accuracy of the first detection unit while reducing noise and improving the detection accuracy of reflected waves, allowing for higher resolution spatial information acquisition.
Implementation Method 1
a radiating unit 11 that radiates electromagnetic waves into a space
Implementation Method 2
the electromagnetic waves including reflected waves resulting from electromagnetic waves radiated by the radiating unit being reflected by an object
Data Source
AI summary
An electromagnetic-wave detection device 10 includes a first detection unit 13, a second detection unit 14, a first aperture 15, a second aperture 16, and a controller 18. The first detection unit 13 detects reflected waves incident from an incidence unit 12. The second detection unit 14 detects electromagnetic waves incident from the incidence unit 12. The second aperture 16 has a second region and a third region. The second region is smaller than a first region. The third region is located around the second region. The third region does not allow electromagnetic waves traveling to the second detection unit 14 to pass therethrough. The controller 18 acquires first spatial information about a space based on detection of electromagnetic waves by the first detection unit 13. The controller 18 acquires second spatial information about the space based on detection of electromagnetic waves by the second detection unit 14.