Signal Electromigration Analysis for Complex Interface Pin Shapes
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Solution Overview
Problem
Current electronic design automation (EDA) systems face challenges in accurately analyzing signal electromigration in digital-on-top designs with complex interface pin shapes, as they often presume connection locations rather than determining actual positions, leading to inaccuracies in parasitic effects calculation.
Innovation Solution
Performing parasitic analysis based on actual location information for the interface between nets and primitive/macro cells, by mapping ports to nets and block nets, and dividing interface pin shapes into segments to determine areas of overlap and paths between them, thereby improving the accuracy of signal electromigration analysis.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If presumed location information is used for connection positions, then analysis speed is improved, but measurement precision of parasitic effects deteriorates
Solution Approach 1:
The interface pin shapes are divided into multiple segments, allowing the system to calculate parasitic effects for each segment individually based on actual connection locations. This segmentation enables accurate parasitic analysis while maintaining computational efficiency by processing discrete segments rather than continuous complex shapes.
Solution Approach 2:
The method performs preliminary identification of actual connection locations between nets and block nets before conducting parasitic effects calculation. By determining the true overlap positions in advance, the system avoids iterative adjustments and achieves both accuracy and efficiency in the subsequent analysis.
2Measurement precision
If actual location information is used for connection positions, then measurement precision of parasitic effects is improved, but device complexity increases
Solution Approach 1:
Complex interface pin shapes are broken down into simpler segments, reducing the computational complexity of handling complex geometries. Each segment can be processed independently, transforming a complex global problem into multiple simpler local problems that are easier to solve.
Solution Approach 2:
The patent introduces an intermediary representation system that maps complex interface pin shapes to simplified segment models. This intermediary layer allows accurate parasitic calculation without directly processing the full complexity of the original interface pin geometries.
3Device complexity
If presumed location information is used, then device complexity is reduced, but reliability of electromigration analysis deteriorates
Solution Approach 1:
The system performs preliminary identification and mapping of actual connection locations before electromigration analysis. By establishing accurate geometric relationships in advance, the analysis model achieves high reliability without requiring complex iterative corrections during the electromigration calculation phase.
Solution Approach 2:
The patent replaces complex mechanical/geometric modeling of interface pin shapes with a simplified segment-based representation system. This substitution maintains analysis reliability by preserving critical geometric relationships while using a computationally simpler model for electromigration calculations.
Data Source
AI summary
An approach is described for efficient and accurate signal electromigration analysis of digital-on-top designs with complex interface pin shapes. According to some embodiments, the approach includes performance of parasitic analysis for the interface between nets and primitive/macro cell (blocks). Specifically, the approach includes performing parasitic analysis based on actual location information corresponding to overlap/connection between ports within blocks, external net connections to the ports, and internal net (block net) connections to the port. Thus, by determining the actual locations of the connections (as opposed to a presumed location) the parasitic effects associated with the ports and the connections thereof can be calculated.