Electron Beam Build Monitoring With In-Situ Defect Repair

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Solution Overview

Problem

Electron beam additive manufacturing systems face challenges in monitoring and controlling build quality in real-time due to long build times and the inability to remove parts for inspection, leading to high costs and potential defects in metal alloy components.

Innovation Solution

A system and method that includes a build chamber with an electron beam source, a detector for real-time monitoring of backscattered energy, and a controller to adjust the electron beam and build platform for adaptive formation of three-dimensional parts, allowing for in-situ defect detection and repair.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If visual light images are used to monitor build quality, then overall dimensional conformity can be assessed, but porosity, microstructure, alloy composition, average density and feature size cannot be detected

Engineering Contradiction:
Improvedefect detection capabilityVSAvoidmonitoring system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent replaces visual light imaging with electron beam-based detection methods. The electron beam interacts with the material to generate signals (backscattered electrons, secondary electrons, X-rays) that provide detailed information about porosity, microstructure, alloy composition, average density and feature size. This substitution of the detection mechanism enables comprehensive defect detection while maintaining system integration within the electron beam manufacturing apparatus.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Reliability

If the part is removed periodically for quality inspection, then defects can be detected, but build time increases and production efficiency decreases

Engineering Contradiction:
Improvebuild quality assuranceVSAvoidbuild time
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The patent implements continuous in-situ monitoring during the electron beam manufacturing process. The detection system operates continuously as the electron beam processes the material, eliminating interruptions for quality inspection. The electron beam serves dual purposes: material processing and quality monitoring, ensuring continuous production while maintaining reliable defect detection throughout the build process.

Inventive Principle:
Principle #20Continuity of useful action

Solution Approach 2:

The system performs self-monitoring where the electron beam used for manufacturing also serves as the detection probe. The same electron beam interacts with the material to both process it and generate detection signals for quality assessment. This self-service approach eliminates the need for separate inspection operations and external intervention, maintaining productivity while ensuring quality.

Inventive Principle:
Principle #25Self-service

3Reliability

If in-situ defect detection is implemented, then defective parts can be identified before completion, but the system complexity and cost increase

Engineering Contradiction:
Improvedefect detection accuracyVSAvoidsystem complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent integrates multiple functions into the electron beam system. The electron beam serves as both the manufacturing tool for material processing and the detection probe for quality monitoring. The detection system utilizes signals naturally generated during electron beam-material interaction (backscattered electrons, secondary electrons, X-rays), eliminating the need for separate dedicated inspection equipment. This multi-functionality reduces overall system complexity while achieving reliable defect detection.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The patent uses the electron beam as an intermediary that bridges manufacturing and inspection functions. The electron beam interacts with the material to produce various signals that carry information about material properties and defects. By utilizing these naturally generated signals as intermediaries, the system achieves comprehensive defect detection without requiring complex external sensing equipment, thereby controlling system complexity.

Inventive Principle:
Principle #24Intermediary (Mediator)

4Manufacturing precision

If high temperature and vacuum conditions are maintained for electron beam manufacturing, then material fusion quality improves, but real-time monitoring capability is limited

Engineering Contradiction:
Improvematerial fusion qualityVSAvoidmonitoring accessibility
Core Design Contradiction:
Manufacturing precisionVSEase of operation

Solution Approach 1:

The patent replaces optical-based monitoring methods with electron beam-based detection. Since electrons can operate effectively in vacuum conditions and the detection signals (backscattered electrons, secondary electrons, X-rays) are generated within the vacuum chamber, the system achieves both high material fusion quality and effective real-time monitoring without requiring atmospheric access or compromising the vacuum environment.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This solution enables real-time monitoring and control of build quality, improving yield by detecting defects during the process and allowing for in-situ repair, thus reducing the need for post-build inspection and minimizing costly re-runs.

Implementation Method 1

at least one electron beam source for directing at least one electron beam into the build chamber and onto the plurality of deposited layers of metallic powder disposed on the build platform to form a melt pool

Methodology Applied
Scientific EffectElectron Beam: Electron Beam

Implementation Method 2

The detector is configured to detect in real-time backscattered energy ejected from at least one of the melt pool and a region being exposed to the at least one electron beam to detect one or more defects in the build part

Methodology Applied
Scientific EffectBackscattered energy: Scattering

Data Source

PatentUS11413698B2System and method for monitoring and controlling build quality during electron beam manufacturing
Publication Date: 2022.08.16 GENERAL ELECTRIC CO
  • US11413698B2 patent drawing
  • US11413698B2 patent drawing
  • US11413698B2 patent drawing

AI summary

A system and method for monitoring and controlling build quality during electron beam manufacturing of a build part. The system may include at least one electron beam source to direct at least one electron beam onto a plurality of deposited layers of metallic powder to form a melt pool, a detector to detect in real-time backscattered energy ejected from the melt pool and indicative of a defect in the build part and generate a detection signal representative of the defect. A controller receives and analyzes the detection signal and generates a corrective signal for control of at least one of the actuator and the at least one electron beam source to direct the at least one electron beam onto the plurality of deposited layers of metallic powder to sequentially consolidate patterned portions of the plurality of deposited metallic powder layers to adaptively form the three-dimensional build part.