Multi-Beam Electron Additive Manufacturing Position Correction
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Solution Overview
Problem
Existing additive manufacturing techniques face challenges in maintaining beam spot quality and positioning over large build volumes, leading to difficulties in producing larger three-dimensional articles without compromising the quality of the final product.
Innovation Solution
The method involves using multiple electron beam sources with settings correction, including coil current, electrostatic lenses, and plates, to align and adjust the positions of the electron beams, accounting for repelling forces between beams, and storing correction values in a look-up table for efficient alignment.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Volume of stationary object
If multiple beam sources are used to increase build volume, then the build volume is improved, but the beam spot quality and beam spot positioning deteriorate
Solution Approach 1:
The patent implements feedback control by measuring the actual beam spot positions and using these measurements to calculate correction values. These correction values are stored in a look-up table and applied to adjust the beam deflection settings, ensuring that beam spot positioning accuracy is maintained across the entire build area even when multiple beam sources are used
Solution Approach 2:
The patent changes the parameters of the beam sources by applying correction values to the beam deflection settings. The system adjusts coil currents and electrostatic lens/plate settings based on measured beam spot positions, thereby dynamically optimizing beam positioning accuracy across the build volume
2Volume of stationary object
If multiple beam sources are used to increase build volume, then the build volume is improved, but the beam spot quality deteriorates
Solution Approach 1:
The system measures actual beam spot qualities and uses this feedback to optimize beam parameters. By monitoring beam spot quality metrics and adjusting beam settings accordingly, the system maintains high beam spot quality across the entire build area when using multiple beam sources
Solution Approach 2:
The patent adjusts beam parameters such as focus settings and beam shape control through electrostatic lenses and plates. These parameter changes are optimized based on measured beam spot qualities to ensure consistent high-quality beam spots across the build volume
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach ensures accurate positioning of electron beams, improving the quality of large three-dimensional articles by maintaining beam spot quality and positioning across the entire build area, reducing manufacturing time, and enhancing the final product's precision.
Implementation Method 1
directing a first electron beam from a first electron beam source over the work table causing the first powder layer to fuse in first selected locations
Implementation Method 2
directing a first electron beam from a first electron beam source over the work table causing the first powder layer to fuse
Implementation Method 3
a coil current in at least one beam source coil for at least one of deflecting or shaping at least one of the electron beam or the beam power
Implementation Method 4
an electrostatic lens for at least one of deflecting or shaping the electron beam
Implementation Method 5
an electrostatic plate for at least one of deflecting or shaping the electron beam
Data Source
AI summary
A method for forming a three-dimensional article comprising the steps of: applying a model of the three dimensional article, applying a first powder layer on a work table, directing a first electron beam from a first electron beam source over the work table causing the first powder layer to fuse in first selected locations according to the model to form a first cross section of the three-dimensional article, directing a second electron beam from a second electron beam source over the work table, registering at least one setting of the first electron beam source, registering at least one setting of the second electron beam source, correcting the position of the second electron beam depending on the at least one setting of the first electron beam source and the at least one setting of the second electron beam source.