Electron Capture Sleeve Coating to Reduce X-Ray Tube Stray Radiation
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
In microfocus X-ray tubes, a significant portion of electrons are absorbed or backscattered, generating stray radiation that degrades image quality and contrast, particularly due to the use of metal components which produce short-wave X-radiation and are prone to thermal issues.
Innovation Solution
The use of a second material with a lower atomic number than the metal components, applied as a coating or separate additional body, to reduce stray radiation by minimizing the interaction of electrons with metal surfaces, thereby preventing the generation of short-wave X-radiation and image errors.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Strength
If metal components (such as diaphragm body, electron optics cores) are used in the X-ray tube, then structural strength and thermal resistance are improved, but stray radiation and short-wave X-radiation are generated which degrade image quality
Solution Approach 1:
The patent applies a coating of material with low atomic number (such as carbon, beryllium, or aluminum) on the surface of metal components (diaphragm body, electron optics cores). This composite structure combines the structural strength and thermal resistance of metal with the low stray radiation properties of low-Z materials, effectively resolving the contradiction between mechanical performance and radiation generation.
2Object-generated harmful factors
If a coating of low atomic number material is applied on metal diaphragm, then stray radiation is reduced, but the coating peels off due to high thermal loads
Solution Approach 1:
The patent creates a layered structure where the inner layer (metal) provides thermal resistance and structural strength, while the outer layer (low-Z material) provides low stray radiation properties. Each layer performs its specific function locally, and the gradient in material properties reduces thermal stress at the interface, preventing coating peeling while maintaining radiation reduction benefits.
3Productivity
If electrons are backscattered from the target, then a second focal spot is formed on the target or target support, but image quality and contrast are degraded
Solution Approach 1:
The patent extracts and removes backscattered electrons from the system by providing dedicated electron capture components (such as electron capture sleeves or collectors) positioned to intercept these electrons before they can form a second focal spot or strike the target support. This separates the harmful backscattered electrons from the useful electron beam, maintaining image quality while preserving electron utilization efficiency.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach effectively reduces stray radiation along the electron beam path, improving image quality by minimizing the penetration of short-wave X-radiation and preventing thermal issues associated with metal components, allowing for stable and high-quality 2D and 3D imaging.
Implementation Method 1
when the electrons strike the diaphragm body short-wave X-radiation forms which penetrates the target and projects an image of the diaphragm pinhole onto the image receptor
Data Source
AI summary
A component part in a vacuum area of an X-ray tube with an opening through which an electron beam is guided. The component part includes a base body made of a first material, wherein the first material is a metal. Arranged on a surface forming the opening is a second material having an atomic number which is smaller than an atomic number of the first material. A target support is attached to an end of the component part. The target support supports a target which is aligned with a lens diaphragm formed at the end of the component part. The target support has a base body made of a first material which is a metal, and a second material formed on a surface of the base body that is selectively exposed to the electron beam and which extends between the target and the lens diaphragm.