Curved Electron Beam Deflector for Fast BSE and SE Separation
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Solution Overview
Problem
Existing electron beam apparatuses struggle to simultaneously detect fast backscattered electrons (BSEs) and secondary electrons (SEs) with high efficiency, particularly at higher acceleration energies up to 100 keV.
Innovation Solution
A signal electron beam deflector is designed with a first electrode and a second electrode, where the second electrode has at least one electron transparent portion. This configuration provides separate optical paths for slow and fast electrons, allowing for simultaneous detection of BSEs and SEs.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If higher acceleration energies (up to 100 keV) are used to generate fast BSEs, then the detection efficiency of fast BSEs is improved, but the detection of SEs becomes difficult due to their different energy ranges
Solution Approach 1:
The detector is divided into multiple segments with different energy thresholds, allowing each segment to detect electrons within specific energy ranges. This enables simultaneous detection of both fast BSEs (high energy) and SEs (low energy) by assigning different detector segments to different energy bands, resolving the contradiction between detecting fast BSEs at high acceleration energies and detecting SEs.
Solution Approach 2:
The patent changes the energy threshold parameter of different detector segments to create energy-selective detection channels. By adjusting the bias voltages and energy filtering parameters of various detector elements, the system can selectively detect electrons of different energies simultaneously, enabling both fast BSE and SE detection at high acceleration energies.
2Device complexity
If a single detection optics is used, then the device complexity is reduced, but the ability to distinguish between different electron types (BSEs and SEs) with different energies is lost
Solution Approach 1:
The detection optics is segmented into multiple independent detection channels, each optimized for specific electron energy ranges. This segmentation allows the system to maintain relatively simple individual detector designs while achieving sophisticated energy discrimination through the combined multi-channel system, balancing device complexity with measurement precision.
Solution Approach 2:
The patent designs a multi-functional detection system where a single detection assembly performs multiple functions: detecting fast BSEs, detecting SEs, and providing energy discrimination. By integrating these functions into one universal detection unit with multiple segments, the system avoids the need for entirely separate detection optics for different electron types, managing complexity while maintaining precision.
3Measurement precision
If larger deflection angles (60° or more) are used to deflect signal electrons, then the energy filtering capability is improved, but the detection efficiency and throughput of the apparatus is reduced
Solution Approach 1:
The patent optimizes the deflection angle parameter to a specific range (greater than 0° and less than 60°) that balances energy filtering capability with detection throughput. By carefully selecting and adjusting the deflection angle parameter, the system achieves sufficient energy discrimination without the excessive deflection angles that would cause significant throughput loss, resolving the contradiction between filtering precision and detection efficiency.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution enables improved detection efficiency of fast BSEs and SEs, increasing the throughput of electron beam apparatuses and providing better contrast for feature detection in electron beam imaging.
Implementation Method 1
a first electrode and a second electrode, wherein the second electrode has at least one electron transparent portion configured for having a portion of a signal electron beam to pass through the at least one electron transparent portion
Implementation Method 2
a first optical path is provided between an entrance opening and an exit opening of the signal electron beam deflector; and a second optical path is provided between the entrance opening and the at least one electron transparent portion
Data Source
AI summary
A signal electron beam deflector for an electron beam apparatus is provided. The signal electron beam deflector includes a first electrode extending in a curved manner; and a second electrode extending in a curved manner and having at least one electron transparent portion configured for a signal electron beam to pass through the at least one electron transparent portion. The first electrode and the second electrode are arranged adjacent to each other to form a space between the first electrode and the second electrode. The space has an entrance opening and an exit opening; a first optical path is provided between the entrance opening and the exit opening; and a second optical path is provided between the entrance opening and the at least one electron transparent portion of the second electrode.


