Electron Diffraction Sample Selection Using Transmittance Screening
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Solution Overview
Problem
Conventional electron beam-based crystal structure analysis methods rely heavily on the measurer's experience and intuition, requiring multiple measurements to select suitable crystals, which is inefficient and time-consuming.
Innovation Solution
A structural analysis device and method that utilizes electron diffraction, displaying transmitted electron data to calculate transmittance and select samples based on predetermined conditions, reducing reliance on human judgment.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If multiple crystals are measured to select suitable samples, then the quality of analysis results is improved, but the time required for measurement increases
Solution Approach 1:
The patent applies preliminary action by calculating and displaying transmittance values for multiple crystal samples before actual electron diffraction measurement. This allows the measurer to pre-screen and identify suitable crystals based on transmittance criteria, so that only the most promising samples undergo time-consuming diffraction measurements, thereby reducing the number of measurements needed and saving time while maintaining result quality
Solution Approach 2:
The patent introduces transmittance calculation as an intermediary step between initial crystal selection and final electron diffraction measurement. This intermediary assessment provides objective quantitative data about crystal quality, serving as a mediator that guides the selection process and reduces reliance on subjective judgment, thereby improving efficiency without compromising the quality of final analysis results
2Ease of operation
If crystal selection relies on measurer's experience and intuition, then flexible judgment is achieved, but measurement efficiency decreases
Solution Approach 1:
The patent implements feedback by providing the measurer with quantitative transmittance data for each crystal sample. This objective feedback complements the measurer's experience and intuition, creating a hybrid decision-making process that maintains flexible judgment while significantly improving measurement efficiency through data-driven guidance
Solution Approach 2:
The system performs self-service by automatically calculating and displaying transmittance values for crystal samples. This automated assessment reduces the burden on the measurer, allowing them to focus on higher-level decision-making while the system handles the quantitative evaluation, thereby improving overall measurement efficiency without eliminating expert judgment
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enhances the efficiency of crystal selection by providing a systematic approach to identify suitable samples for electron diffraction, reducing dependency on experience and improving the quality of analysis results.
Implementation Method 1
transmitted electron data being data of transmitted electrons obtained by irradiating a region including the multiple samples with an electron beam
Implementation Method 2
structural analysis device employing electron diffraction
Data Source
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AI summary
Summary [Problem] To provide a configuration capable of further supporting measurement in electron diffraction. [Solution] According to one aspect of the present invention, a structural analysis device using electron diffraction is provided. This structural analysis device is provided with at least one processor capable of executing a program so as to perform the following steps. In a display step, an image including a plurality of samples is displayed from transmitted electronic data, wherein the transmitted electronic data is transmitted electron data obtained by irradiating a region including the plurality of samples with an electron beam. In a calculation step, transmittance of each of the plurality of samples is calculated on the basis of the transmitted electronic data. In a selection step, at least one sample satisfying a predetermined condition is selected from within the image, wherein the predetermined condition is a condition related to the transmittance.