Electron Emitter Geometry Matching for Quality Estimation
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Solution Overview
Problem
Conventional methods for assessing electron emitter geometry and component quality in X-ray tubes are inadequate, leading to incomplete parameterization and failure to accurately represent or differentiate various types of deformations, particularly in thermionic emitters, which affects component lifespan and field performance.
Innovation Solution
A computer-implemented method using an AI model to estimate component quality by transforming an electron emitter geometry model onto an image dataset, determining the degree of similarity with other emitters, and estimating component quality based on this similarity, potentially involving machine learning and neural networks to enhance differentiation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If comprehensive parameterization of electron emitter geometry is performed using measuring machines and complex automation, then measurement precision and completeness are improved, but measurement time and device complexity increase significantly
Solution Approach 1:
The patent uses optical copying techniques to create digital images of the electron emitter geometry, replacing physical measurement with image-based analysis. This allows comprehensive geometry capture without the time penalty of manual measuring machine operations, as the entire emitter geometry is captured in a single or few images rather than through sequential point-by-point measurement
Solution Approach 2:
The patent replaces mechanical measuring machines with optical imaging systems and automated image processing algorithms. This substitution eliminates the need for complex mechanical automation while achieving comprehensive geometry parameterization through digital image analysis, significantly reducing measurement time
2Ease of manufacture
If measurement points are selected based on already known deformations, then measurement effort is reduced, but previously unknown deformations remain undetected
Solution Approach 1:
The patent applies excessive action by capturing the entire electron emitter geometry rather than only selected measurement points. The full geometric information is acquired through optical imaging, and then only the relevant portions are analyzed for deformation. This ensures no unknown deformations are missed while keeping processing efficient through selective analysis of the comprehensive data set
Solution Approach 2:
The system performs self-service by automatically analyzing the complete geometry data for deformations without requiring pre-selection of measurement points based on prior knowledge. The automated image processing algorithm independently identifies all deformations present in the captured geometry, making the process reliable without sacrificing efficiency
3Productivity
If only a small number of measurement points are acquired to minimize manual effort, then measurement time is reduced, but measurement precision and comprehensiveness deteriorate
Solution Approach 1:
The patent creates a complete digital copy of the electron emitter geometry through optical imaging, capturing all geometric features simultaneously. This full geometric replica enables comprehensive parameterization without requiring multiple discrete measurement points, achieving both high precision and high productivity through single-shot imaging
Data Source
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AI summary
The invention relates to a computer-implemented method for estimating the component quality of an electron emitter, comprising the following steps: - Receiving an electron emitter image data set, wherein image information from the electron emitter image data set at least partially depicts the electron emitter inserted into the cathode head, - Receiving an electron emitter geometry model from a storage unit, - Transforming the received electron emitter geometry model onto the image information from the electron emitter image data set, wherein an electron emitter geometry information of the electron emitter is calculated as an output parameter of the transformation, - Determining a degree of similarity of the inserted electron emitter with at least one other electron emitter using the electron emitter geometry information.- Estimating the component quality depending on the determined degree of similarity with at least one other electron emitter.