Electron Gun Aberration Reduction via Electrostatic Lens Control

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Solution Overview

Problem

Conventional electron guns employing Butler type lenses suffer from large aberration, which limits their luminance and resolution, and the combination with magnetic field lenses complicates the structure and alignment, affecting the stability and operability of electron microscopes and beam application devices.

Innovation Solution

An electron gun design featuring a needle-like field emission electron source, an acceleration electrode, a control electrode with a larger aperture diameter, and a control section to manage the potential applied to the control electrode, generating a compact electric field and minimizing aberration through a short focal length electrostatic lens.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If Butler type electron lenses are used in the electron gun, then the structure is streamlined and size is reduced, but the aberration becomes large which limits luminance and resolution

Engineering Contradiction:
Improvestructure complexityVSAvoidaberration
Core Design Contradiction:
Device complexityVSManufacturing precision

Solution Approach 1:

The electron gun is divided into multiple electrode sections (control electrode, acceleration electrode, focus electrode) with distinct functions. Each electrode is optimized independently to control specific aspects of electron beam formation, allowing aberration reduction while maintaining structural efficiency

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different regions of the electron gun employ different electrode configurations and potentials. The control electrode near the electron source uses a larger aperture diameter to reduce spherical aberration, while downstream electrodes are optimized for focusing and acceleration, creating locally optimized conditions throughout the beam path

Inventive Principle:
Principle #3Local quality

2Manufacturing precision

If magnetic field lens is combined with electrostatic lens to reduce aberration, then luminance and resolution are improved, but the structure becomes complicated and alignment becomes difficult

Engineering Contradiction:
ImproveaberrationVSAvoidstructure complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

Multiple electrostatic lens functions (control, acceleration, focus) are merged into a compact sequence of electrodes within the electron gun. This integration achieves aberration control through electrostatic fields alone, eliminating the need for separate magnetic field lens systems and their associated alignment complexities

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The electrostatic lens system performs multiple functions simultaneously: the control electrode manages field emission and initial beam formation, the acceleration electrode provides beam acceleration, and the focus electrode controls beam convergence. This multi-functionality reduces the need for separate dedicated components

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Device complexity

If conventional Butler type electron gun is used, then structure is compact, but the virtual focal position fluctuates when acceleration voltage changes, affecting stability and operability

Engineering Contradiction:
Improvestructure complexityVSAvoidvirtual focal position stability
Core Design Contradiction:
Device complexityVSStability of the object's composition

Solution Approach 1:

The electron gun employs dynamic control of electrode potentials to maintain stable virtual focal position across varying acceleration voltages. The control electrode potential is adjusted in response to acceleration voltage changes, dynamically compensating for focal position drift and maintaining operational stability

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The control electrode serves as a feedback mechanism that responds to changes in acceleration voltage by adjusting its potential accordingly. This feedback control stabilizes the virtual focal position, ensuring consistent beam formation and imaging performance across different operating conditions

Inventive Principle:
Principle #23Feedback

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This design reduces aberration and stabilizes the virtual focal position, enabling high-resolution imaging with enhanced luminance and operability, even under lower acceleration voltages, and allows for a more compact and streamlined electron gun structure.

Implementation Method 1

a needle-like electron source acting as a field emission type electron source

Methodology Applied
Scientific EffectField emission: Electron Beam

Implementation Method 2

an acceleration electrode to accelerate electrons emitted from the electron source

Methodology Applied
Scientific EffectElectrostatic acceleration: Electrostatics

Implementation Method 3

generating a compact electric field and minimizing aberration through a short focal length electrostatic lens

Methodology Applied
Scientific EffectElectrostatic lens: Electrostatic Lens

Data Source

PatentUS9570268B2Electron gun, charged particle gun, and charged particle beam apparatus using electron gun and charged particle gun
Publication Date: 2017.02.14 HITACHI HIGH TECH CORP
  • US9570268B2 patent drawing
  • US9570268B2 patent drawing
  • US9570268B2 patent drawing

AI summary

The purpose of the present invention is to provide a charged particle gun using merely an electrostatic lens, said charged particle gun being relatively small and having less aberration, and to provide a field emission-type charged particle gun having high luminance even with a high current. This charged particle gun has: a charged particle source; an acceleration electrode that accelerates charged particles emitted from the charged particle source; a control electrode, which is disposed further toward the charged particle source side than the acceleration electrode, and which has a larger aperture diameter than the aperture diameter of the acceleration electrode; and a control unit that controls, on the basis of a potential applied to the acceleration electrode, a potential to be applied to the control electrode.