Electron Microscope Imaging for Capsule Removal in Liquid Samples
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Solution Overview
Problem
Existing electron microscopes struggle to remove the capsule from observation images without reproducing phase information, as they lack essential components like an electron biprism, hindering effective separation and observation of samples in gases or liquids.
Innovation Solution
An electron microscope system that controls the direction of the electron beam to acquire multiple observation images, generates an averaged image, and subtracts capsule images to remove them from the sample images, optionally using machine learning for noise reduction.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If a capsule is used to seal the sample in gas or liquid, then the sample can be observed in its native environment, but the capsule appears in the observation image and hinders sample observation
Solution Approach 1:
The invention extracts and removes the capsule image from the composite observation image by acquiring images from multiple electron beam directions, separating the capsule signal from the sample signal through directional differentiation, and reconstructing an image with the capsule removed while preserving the sample information
Solution Approach 2:
The invention adds the dimension of electron beam direction by acquiring observation images from multiple directions (e.g., 0 degrees, 45 degrees, 90 degrees, 135 degrees). This multi-directional approach enables separation of the capsule and sample signals that are mixed in single-direction images, allowing capsule removal while maintaining sample visibility
2Measurement precision
If an electron biprism is used to reproduce phase information, then capsule separation can be achieved, but the device complexity increases as general electron microscopes do not include this component
Solution Approach 1:
The invention replaces the complex mechanical electron biprism system with a control-based approach using the existing electron beam direction control capabilities of the electron microscope. By controlling the electron beam direction and processing multiple images computationally, the system achieves capsule separation without requiring additional complex hardware components
Solution Approach 2:
The invention introduces multiple observation images from different electron beam directions as intermediaries. These intermediate images serve as the basis for computational processing that separates the capsule and sample signals, replacing the direct phase information reproduction function of the electron biprism with an indirect computational approach
3Object-affected harmful factors
If multiple observation images are acquired from different electron beam directions, then capsule removal can be achieved, but the observation time increases
Solution Approach 1:
The invention uses a limited set of discrete electron beam directions (e.g., 0, 45, 90, 135 degrees) rather than continuous angular scanning. This partial action approach provides sufficient information for capsule separation while significantly reducing the observation time compared to exhaustive multi-directional imaging
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables clear observation of samples by effectively removing capsule components from the observation images without requiring phase information reproduction, enhancing image clarity and detail.
Implementation Method 1
an electron source configured to emit an electron beam with which a sample is irradiated
Implementation Method 2
a detector configured to detect an electron emitted from the sample and a sample peripheral object disposed around the sample
Data Source
AI summary
An electron microscope includes: an electron source configured to emit an electron beam with which a sample is irradiated; a detector configured to detect an electron emitted from the sample and a sample peripheral object disposed around the sample; and a control unit configured to acquire an observation image based on a detection signal output from the detector. The control unit acquires the observation image for each of directions of the electron beam by controlling the direction of the electron beam with respect to the sample, and removes an image of the sample peripheral object from the observation image using an averaged image obtained by averaging the observation images.