Electron Microscope Carrier with Flow Buffer for Liquid Samples

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Solution Overview

Problem

Existing electron microscopes face challenges in observing liquid samples due to fluid disturbances and temperature control, which can damage the sample film and require additional space and cost for fluid flow management.

Innovation Solution

An electron microscope design incorporating a carrier with a flow-buffer unit and temperature control mechanisms, where a first fluid flows through the sample and a second fluid adjusts the temperature of the first fluid, reducing disturbances and eliminating the need for an additional pump by utilizing the existing evacuation apparatus.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If fluid is driven to flow through the film to remove metabolites or add agents, then the liquid sample can be observed successfully, but the film may be damaged due to fluid disturbance

Engineering Contradiction:
Improveobservation successVSAvoidfilm damage
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

The patent introduces a flow buffer as an intermediary component between the fluid source and the sample film. The flow buffer receives fluid from the driving source, performs buffering to stabilize and calm the fluid flow, and then releases the buffered fluid through a narrow opening onto the sample. This intermediary structure reduces direct fluid disturbance on the film while maintaining the necessary fluid flow for metabolite removal and agent delivery.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Ease of operation

If an additional driving source is added to drive fluid flow, then fluid management is achieved, but the device size and cost increase

Engineering Contradiction:
Improvefluid flow controlVSAvoiddevice size and cost
Core Design Contradiction:
Ease of operationVSDevice complexity

Solution Approach 1:

The patent makes the evacuation apparatus perform multiple functions: it not only evacuates the chamber to create vacuum conditions for electron microscopy, but also serves as the driving source to pump fluid through the sample. By reusing an existing component for dual purposes, the patent eliminates the need for a separate driving source, thereby reducing device complexity, size, and cost while maintaining effective fluid flow control.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This design allows successful observation of liquid samples by minimizing film damage and reducing the size and cost of the electron microscope, while maintaining precise temperature control and fluid management.

Implementation Method 1

The flow-buffer unit is disposed on the first flow path to perform buffering on the first fluid

Methodology Applied
Scientific EffectBuffering:

Implementation Method 2

a second fluid flows along the second passage to adjust a temperature of the first fluid

Methodology Applied
Scientific EffectTemperature adjustment:

Implementation Method 3

The evacuation module evacuates the first chamber and drives a first fluid to flow through the sample

Methodology Applied
Scientific EffectEvacuation:

Implementation Method 4

The electron source provides an electron beam to the sample

Methodology Applied
Scientific EffectElectron beam: Electron Beam

Data Source

PatentUS9842722B2Electron microscope having a carrier
Publication Date: 2017.12.12 IND TECH RES INST
  • US9842722B2 patent drawing
  • US9842722B2 patent drawing
  • US9842722B2 patent drawing

AI summary

An electronic microscope includes a carrier, a first driving unit, a flow-buffer unit and an electron source. The carrier carries a sample. The first driving unit drives a first fluid to flow along a first flow path, wherein the first flow path passes through the sample. The flow-buffer unit is disposed on the first flow path to perform buffering on the first fluid, wherein the first fluid flows through the flow-buffer unit and the carrier in sequence. The electron source provides an electron beam to the sample.