Electron Microscope Noise Cancellation via Signal Multiplication
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Solution Overview
Problem
Existing electron microscopes face challenges in achieving low noise levels and high-speed operation due to the need for complex analog divider circuits and slow digital division methods, which limit frequency bandwidth and increase noise components.
Innovation Solution
An electron microscope design that eliminates the need for divider circuits by performing multiplication operations between noise and image signal detectors, allowing for noise cancellation without digital division, thereby reducing noise levels and enabling high-speed operation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If analog divider circuits are used for noise cancellation, then noise can be cancelled, but noise components increase and frequency bandwidth is limited
Solution Approach 1:
The patent extracts the division operation from the signal path by using a separate reference signal that has already undergone division. The main signal path only requires multiplication, which eliminates the need for analog divider circuits in the critical signal path and reduces noise components.
Solution Approach 2:
The patent introduces a reference signal as an intermediary that carries the divided information. This reference signal acts as a mediator between the original signal and the final processed signal, allowing the main path to avoid direct division operations that generate noise.
2Reliability
If digital division methods are used for noise cancellation, then noise can be cancelled, but processing speed decreases
Solution Approach 1:
The patent performs the division operation in advance on a reference signal before it enters the main processing path. This preliminary action allows the main signal processing to only require multiplication operations, which are computationally faster and enable high-speed operation.
3Speed
If divider circuits are eliminated and multiplication operations are used, then processing speed increases and noise decreases, but the noise cancellation mechanism changes
Solution Approach 1:
The patent changes the mathematical operation from division to multiplication by transforming the reference signal in advance. This parameter change in the operation type enables faster processing and lower noise while maintaining the essential noise cancellation function through a different mathematical approach.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach results in a low-noise electron microscope that can operate at high speeds, reducing processing load and allowing for noise-free imaging without the limitations of analog or digital division methods.
Implementation Method 1
a noise detector for detecting a part of the electron beam to thereby produce a beam detection signal
Data Source
AI summary
An electron microscope is offered that is capable of achieving noise cancellation which results in a low level of noise and which can be implemented at high speed. An electron microscope (1) associated with the present invention includes: an electron beam source (11) for producing an electron beam; a noise detector (4) for detecting a part of the beam to thereby produce a beam detection signal and dividing a dividend by the beam detection signal; at least one image signal detector (6) for detecting an image signal obtained by making the beam impinge on a sample (A); and an arithmetic section (60) for performing a multiplication between an output signal of the image signal detector (6) and an output signal of the noise detector (4).