Electron Multiplier Layout for Higher Mass Spectrometry Ion Detection

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Solution Overview

Problem

Conventional mass spectrometer detectors face inefficiencies in ion detection, particularly in directing ions and secondary particles to optimize signal gain, as they often impact the channel area instead of the collector area, leading to sub-optimal sensitivity and detection efficiency.

Innovation Solution

The detector system is configured to direct ions and secondary particles directly to the collector area of the electron multiplier by positioning the electron multiplier and dynode relative to the exit lens, using specific voltage ranges to ensure that ions and secondary particles are steered away from the channel area, enhancing the overall gain and sensitivity of the mass spectrometer.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If ions are directed to the channel area of the electron multiplier, then the detector can operate in conventional mode, but the detection efficiency and signal intensity are sub-optimal

Engineering Contradiction:
Improvedetection efficiencyVSAvoidconventional detector operation
Core Design Contradiction:
Measurement precisionVSEase of operation

Solution Approach 1:

The electron multiplier surface is segmented into distinct functional zones: a channel area for conventional electron multiplication and a collector area for direct ion collection. This segmentation allows the detector to optimize performance for different ion types and detection modes, improving overall detection efficiency while maintaining operational flexibility.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The invention introduces a spatial dimension distinction by creating separate collection zones (channel area vs. collector area) on the electron multiplier surface. By positioning these areas in different spatial locations and controlling ion trajectories to target specific zones, the system achieves enhanced detection efficiency without compromising ease of operation.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Quantity of substance

If the electron multiplier is positioned to direct ions to the collector area, then signal intensity improves, but the device configuration becomes more complex

Engineering Contradiction:
Improvesignal intensityVSAvoiddetector configuration
Core Design Contradiction:
Quantity of substanceVSDevice complexity

Solution Approach 1:

The invention merges the ion detection function with the electron multiplication function in a single integrated detector structure. By combining the collector area (for direct ion collection) and channel area (for electron multiplication) within one electron multiplier device, the system achieves high signal intensity without requiring separate detection components, thus limiting the increase in device complexity.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The electron multiplier is designed to perform multiple functions: it can detect ions directly impacting the collector area, detect secondary electrons from the channel area, and operate in both positive and negative ion modes. This multi-functionality allows the detector to achieve high signal intensity across different detection scenarios without requiring multiple specialized devices.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Reliability

If ions impact the channel area, then the detector structure is simpler, but the sensitivity and performance decrease

Engineering Contradiction:
ImprovesensitivityVSAvoidion trajectory control
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

Different regions of the electron multiplier are assigned different functional qualities: the channel area is optimized for electron multiplication with its characteristic dynode structure, while the collector area is optimized for direct ion collection with appropriate electrical potential. This local differentiation ensures high sensitivity for each detection mode without requiring complex trajectory control mechanisms.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The electrical potential distribution within the detector automatically guides ions to the appropriate collection area based on their charge and trajectory. The system uses its own internal electric fields to self-direct ions without requiring external deflection mechanisms or complex control systems, thereby maintaining simplicity while achieving high sensitivity.

Inventive Principle:
Principle #25Self-service

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration significantly improves the detection efficiency and signal intensity by preventing sub-optimal ion trajectories and ensuring that particles impact the collector area, thereby increasing the sensitivity and performance of the mass spectrometer.

Implementation Method 1

Voltages are applied to HED 210 and detector 220 establishing an electric field along axis 260

Methodology Applied
Scientific EffectElectric field: Electric Field

Implementation Method 2

HED 210 converts the negative ions to secondary positive particles. The secondary positive particles are then directed by the electric field along path 290 to detector 220

Methodology Applied
Scientific EffectSecondary particle generation: Electron Impact Desorption

Data Source

PatentEP3257067B1Device for improved detection of IONS in mass spectrometry
Publication Date: 2023.10.11 DH TECH DEVMENT PTE
  • EP3257067B1 patent drawingFigure 1~2
  • EP3257067B1 patent drawingFigure 3~4
  • EP3257067B1 patent drawingFigure 5~6

AI summary

An electron multiplier is positioned relative to at least one dynode to direct a beam of secondary particles from the at least one dynode to a collector area of the electron multiplier and not to a channel area of the electron multiplier for a range of electron multiplier voltages applied by one or more voltage sources to the electron multiplier and for a dynode voltage applied by the one or more voltage sources to the at least one dynode. The electron multiplier includes an aperture with an entrance cone and walls of the entrance cone comprise the collector area and an apex of the entrance cone comprises the channel area. An electron multiplier voltage of the range of electron multiplier voltages is applied to the electron multiplier and the dynode voltage is applied to the at least one dynode using the one or more voltage sources.