Electron Multiplying Gate Voltage Adjustment for Image Sensor Aging
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Electron multiplying solid-state image pickup devices face challenges in maintaining optimal electron multiplying gain due to aging, which affects image quality and stability, as the gain can shift over time due to factors like environmental changes and device degradation.
Innovation Solution
An electron multiplying solid-state image pickup apparatus and method that includes an electron multiplying unit, a test signal supply unit, and a control unit to adjust the voltage applied to the electron multiplying gate electrode, using a test signal to compare and adjust the gain to ensure it meets a predetermined level, thereby minimizing the impact of aging and maintaining optimal performance.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the voltage applied to the electron multiplying gate electrode is increased to maintain optimal electron multiplying gain, then the electron multiplying gain is improved, but the device complexity increases due to the need for voltage adjustment mechanisms and test signal systems
Solution Approach 1:
The patent implements a feedback mechanism where a test signal is supplied to the electron multiplying unit, the output signal level is detected and compared with a reference level, and the voltage applied to the electron multiplying gate electrode is adjusted based on this comparison. This closed-loop feedback system automatically maintains optimal electron multiplying gain without requiring complex manual adjustment mechanisms, thereby improving reliability while managing device complexity through automation.
Solution Approach 2:
The system performs self-adjustment by using its own output signal to control its input voltage. The test signal passes through the electron multiplying unit, and the resulting signal level directly controls the voltage adjustment to the gate electrode. This self-service mechanism eliminates the need for external complex control systems, maintaining gain stability while minimizing added device complexity.
2Reliability
If the voltage applied to the electron multiplying gate electrode is adjusted frequently to compensate for aging effects, then the electron multiplying gain stability is improved, but the loss of time increases due to repeated calibration operations
Solution Approach 1:
The patent implements continuous monitoring and adjustment of the electron multiplying gain through the test signal system. Rather than periodic recalibration, the system continuously supplies test signals, detects output levels, and adjusts voltages in real-time. This continuous action eliminates downtime for recalibration and maintains gain consistency without interrupting operation, thereby improving reliability while minimizing time loss.
Solution Approach 2:
The system performs preliminary adjustment by proactively detecting gain deviations through test signals before they affect image quality. The test signal continuously monitors the electron multiplying unit's performance, and voltage adjustments are made in advance to prevent gain drift from impacting actual imaging operations, thus maintaining stability without requiring time-consuming corrective recalibration.
3Measurement precision
If a test signal system is implemented to monitor and adjust electron multiplying gain, then the measurement precision of gain level is improved, but the device complexity increases due to additional components
Solution Approach 1:
The test signal system is designed to serve multiple functions: it monitors electron multiplying gain, provides a reference for comparison, and enables automatic voltage adjustment. By making the test signal system multi-functional, the patent achieves high measurement precision without proportionally increasing device complexity, as the same components perform multiple measurement and control tasks simultaneously.
Solution Approach 2:
The patent merges the test signal supply, signal detection, reference level comparison, and voltage adjustment control into an integrated system. Rather than separate independent components, these functions are combined into a unified gain control mechanism, reducing overall device complexity while maintaining high measurement precision through the coordinated operation of merged functional blocks.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution allows for precise adjustment of electron multiplying gain, minimizing the effects of aging and ensuring consistent image quality by continuously monitoring and adjusting the gain, thus maintaining stable operation and reducing the need for frequent recalibration.
Implementation Method 1
the impact ionization means that electrons accelerated by an electric field collide with a crystal lattice to generate a pair of an electron and a hole
Implementation Method 2
An electron as the signal charge 141 is accelerated due to the large potential difference 131 and collides with a silicon crystal lattice
Data Source
AI summary
An electron multiplying solid-state image pickup apparatus which obtains a desired electron multiplying gain through adjusting a voltage applied to an electron multiplying gate electrode includes an electron multiplying unit, a test signal supply unit and a control unit. The electron multiplying unit multiplies an electron corresponding to an input signal by an electric field generated by the applied voltage. The test signal supply unit supplies a test signal to the electron multiplying unit. The control unit compares a level of the test signal multiplied by the electron multiplying unit with an expected level determined in advance, and adjusts the voltage applied to the electron multiplying gate electrode so that the multiplied test signal level is equal to or larger than the expected level.