Electron Source Manufacturing Method for Uniform Emission

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Solution Overview

Problem

Conventional electron sources, such as the ZrO/W electron source, suffer from non-uniformity in emission current density due to surface damage during machining, leading to fluctuations in electron beam irradiation and reduced operational reliability, especially at high angular intensities.

Innovation Solution

A process involving machining to form a conical and flat electron emitting portion on a single crystal rod, followed by chemical or electrolytic polishing to remove damaged layers, ensuring a uniform emission current distribution.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Shape

If machining is performed to form a conical and flat electron emitting portion, then the shape and structure of the electron source is defined, but a damaged layer is created on the surface causing non-uniform emission current density

Engineering Contradiction:
Improveconical and flat electron emitting portionVSAvoidemission current density uniformity
Core Design Contradiction:
ShapeVSManufacturing precision

Solution Approach 1:

The patent applies chemical or electrolytic polishing as a preliminary treatment step after machining to remove the damaged layer created during mechanical formation of the conical and flat electron emitting portion. This preliminary removal of surface damage before electron emission operation ensures uniform emission current density across the emitting surface.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent converts the harmful effect of mechanical damage from machining into a beneficial process by using controlled chemical or electrolytic polishing. The damaged layer, which would otherwise cause non-uniform emission, is transformed into a removable surface layer that, when eliminated through polishing, reveals a uniform underlying surface for consistent electron emission.

Inventive Principle:
Principle #22Blessing in disguise (Convert harm into benefit)

2Productivity

If high angular intensity operation is performed to increase throughput, then productivity is improved, but arc discharge failure frequency increases due to high field intensity

Engineering Contradiction:
ImprovethroughputVSAvoidarc discharge failure frequency
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The patent implements monitoring and control mechanisms to detect early signs of arc discharge and adjust operating parameters accordingly. By monitoring the electron emission characteristics and field intensity, the system can provide feedback to prevent arc discharge events, allowing sustained high angular intensity operation without excessive failure frequency.

Inventive Principle:
Principle #23Feedback

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The process achieves a highly uniform emission current distribution, enhancing the reliability and performance of electron sources for applications like scanning electron microscopes and electron beam lithography machines.

Implementation Method 1

The cathode 1 is Joule heated by the filament 3 and used usually at a temperature of about 1,800 K

Methodology Applied
Scientific EffectJoule heating: Joule Heating

Implementation Method 2

from the diffusing source 2, zirconium and oxygen will diffuse and will be continuously supplied to the surface of the cathode 1

Methodology Applied
Scientific EffectDiffusion: Diffusion

Implementation Method 3

removing a damaged layer on the surface of the formed electron emitting portion by chemical polishing or electrolytic polishing

Methodology Applied
Scientific EffectChemical polishing:

Implementation Method 4

removing a damaged layer on the surface of the formed electron emitting portion by chemical polishing or electrolytic polishing

Methodology Applied
Scientific EffectElectrolytic polishing:

Data Source

PatentUS7722425B2Electron source manufacturing method
Publication Date: 2010.05.25 DENKA CO LTD
  • US7722425B2 patent drawing
  • US7722425B2 patent drawing
  • US7722425B2 patent drawing

AI summary

An electron source excellent in the uniformity in current emission distribution is provided certainly and at a low cost.A process for producing an electron source having an electron emitting portion at one end of a rod, which comprises a step of forming the electron emitting portion by machining, and a step of removing a damaged layer at the surface of the formed electron emitting portion by chemical polishing or electrolytic polishing.