Remanufacturing Electronic Assemblies Using Test Fixture Simulation
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Solution Overview
Problem
Existing methods for testing and remanufacturing electronic assemblies are inadequate for partially disassembled circuits, as they require reassembly or indirect interfacing, leading to increased complexity and error potential, especially when components are affixed to the housing for heat transfer and mechanical support, making it difficult to access and test the remaining components.
Innovation Solution
A test fixture system that includes a test frame with connector assemblies and pins to simulate the removed components, allowing the partially disassembled circuit to be tested as if the components had not been removed, by affixing replacement components to the test frame that mate with the empty sockets of the circuit assembly.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Temperature
If components are affixed to housing for heat transfer and mechanical support, then thermal management and structural stability are improved, but accessibility for testing and repair deteriorates
Solution Approach 1:
The housing is divided into removable portions that can be detached to expose the circuit board. This segmentation allows the housing to maintain its thermal and mechanical functions while providing access to components for testing and repair without requiring complete disassembly.
Solution Approach 2:
The circuit board is extracted from the housing structure, allowing it to be removed and tested separately. This extraction enables independent testing of the circuit board while the housing remains intact with its thermal management and mechanical support functions.
2Ease of operation
If components are removed from circuit board for access, then accessibility for repair is improved, but testing capability deteriorates
Solution Approach 1:
Connector assemblies with replacement components serve as intermediaries between the test fixture and the circuit board. These connectors restore the electrical pathways that would otherwise be interrupted by removed components, enabling full testing capability while maintaining repair accessibility.
Solution Approach 2:
Replacement components in the connector assemblies replicate the electrical characteristics of the original removed components. This copying allows the circuit board to be tested as if the original components were still present, while the physical components remain removed for accessibility.
3Adaptability or versatility
If indirect interfacing through test boards is used, then testing of disassembled boards is enabled, but device complexity and error potential increase
Solution Approach 1:
The intermediate test boards are extracted from the testing system. Instead of routing signals through complex test boards, the connector assemblies directly interface with the circuit board using replacement components that replicate the original component interfaces, simplifying the overall fixture design.
Solution Approach 2:
The connector assemblies serve multiple functions: they provide mechanical support, establish electrical connections, and replicate the electrical characteristics of removed components. This multi-functionality eliminates the need for separate, complex test board interfaces.
Data Source
AI summary
A method for remanufacturing an electronic assembly allows the assembly to be disassembled, tested and reassembled despite certain components being permanently affixed to a housing of the assembly. The electronic assembly includes a circuit assembly within the housing. During remanufacture, a first portion of the housing is removed to expose a first side of the circuit assembly and a second portion of the housing is removed to expose a second side of the circuit assembly. When removing the second portion of the housing, one of the components of the circuit assembly may also be removed. During remanufacture a connector assembly including a replacement component substantially similar to the removed component, and including one or more pins connected to the replacement component and situated to mate with one or more empty sockets of the circuit assembly is used to facilitate testing of the assembly.