Electronic Component Thickness Measurement Using Polarization Contrast
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Solution Overview
Problem
Existing methods for measuring the thickness of electronic components mounted on transparent plates, such as the light section method, face challenges due to low reflection coefficients and multi-reflections from the transparent material, making it difficult to accurately determine the position of reflected waves and thus the component's thickness.
Innovation Solution
The method involves applying a first electromagnetic wave obliquely to an electronic component and a transparent plate, receiving and forming image data with reference lines from reflected waves, then applying a second electromagnetic wave with a different polarization direction to distinguish and extract the correct reference line for thickness calculation, allowing for precise measurement.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the light section method is used to measure the thickness of an electronic component mounted on a transparent plate, then the thickness measurement can be performed, but the measurement precision deteriorates due to low reflection coefficient and multi-reflection from the transparent plate
Solution Approach 1:
The patent changes the parameter of electromagnetic wave polarization by applying two electromagnetic waves with different polarization directions (first and second polarization directions) to distinguish between reflections from the electronic component and the transparent plate. This parameter change enables accurate identification of the correct reference line for thickness measurement despite multi-reflection issues.
2Reliability
If electromagnetic wave is applied to measure thickness, then thickness calculation is possible, but the reliability deteriorates due to inability to clearly identify the reference line position from transparent plate reflection
Solution Approach 1:
The patent applies electromagnetic waves with different polarization directions to create distinguishable reflection patterns. By comparing the reflected waves from differently polarized incident waves, the system can reliably identify which reference line corresponds to the transparent plate surface, even when multiple reflections are present.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables accurate thickness measurement of electronic components by effectively differentiating between reflections from the component and the transparent plate, overcoming the limitations of low reflection coefficients and multi-reflections, and achieving high precision in thickness determination.
Implementation Method 1
light is applied to an electronic component and the transparent plate, and the thickness of the electronic component is measured based on the distance between the position where the reflected light which is reflected from the upper surface of the electronic component is received and the position where the reflected light reflected from the upper surface of the transparent plate is received
Implementation Method 2
a part of the applied light causes multi-reflection in the transparent plate
Implementation Method 3
applying a second electromagnetic wave, which is different from the first electromagnetic wave in direction of polarization
Data Source
AI summary
An electronic component thickness measurement method includes extracting, from a plurality of second reference lines in first image data and a plurality of second reference lines in second image data, only a second reference line at which a difference in intensity peak between respective second reference lines at a same position in the first image data and the second image data is smallest, and forming third image data including a first reference line and the extracted second reference line, and calculating a thickness of the electronic component from a distance between the first reference line and the second reference line in the third image data.