Electronic Component Fault Diagnosis via Physics of Failure Tree
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Solution Overview
Problem
Current methods for close-loop analysis of electronic component faults lack the ability to accurately locate and diagnose internal failures due to the complexity of failure mechanisms and the inability to measure internal fault problems directly, leading to ineffective improvement measures.
Innovation Solution
A method and system that establish a fault tree of physics of failure, convert it into a failure locating fault tree, and create a fault dictionary to systematically analyze electronic component failures, using observable parameters like electrical, thermal, and mechanical properties to identify failure mechanisms and propose targeted control measures.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If fault tree analysis is applied to electronic components, then the systematic analysis capability is improved, but the ability to accurately locate internal failures deteriorates due to the complexity of failure mechanisms
Solution Approach 1:
The patent segments the failure analysis process into multiple hierarchical levels: component level, subsystem level, and system level. By dividing the complex failure mechanisms into smaller, manageable segments that can be analyzed independently and then integrated, the method maintains systematic analysis capability while improving failure location accuracy through progressive refinement.
Solution Approach 2:
The patent introduces intermediate analysis layers between the fault tree analysis and the actual failure location determination. These intermediate layers include failure mode classification, mechanism identification, and evidence integration steps that act as mediators to bridge the gap between systematic analysis and precise failure localization.
2Measurement precision
If destructive observation is conducted to determine failure mechanism, then the failure mechanism identification is improved, but the component integrity deteriorates
Solution Approach 1:
The patent performs preliminary non-destructive characterization and documentation of the component's initial state before conducting destructive observation. This preliminary action preserves the component's historical information and allows for post-test reconstruction, maintaining a record of the component's integrity state before failure analysis.
Solution Approach 2:
The patent implements a controlled destructive testing approach where the destructive observation is performed in a controlled manner with predetermined stopping points and preservation protocols. This cushioning approach ensures that the destructive process reveals failure mechanisms systematically while preserving any remaining component structure for further analysis or documentation.
3Productivity
If existing fault dictionary method is used, then the fault diagnosis speed is improved, but the accuracy for electronic component specific failures deteriorates
Solution Approach 1:
The patent creates a specialized fault dictionary tailored specifically for electronic components with locally optimized diagnostic criteria, failure modes, and characteristic parameters. This local quality approach replaces the generic fault dictionary with component-specific knowledge that maintains diagnostic speed while significantly improving accuracy for electronic component failures.
Solution Approach 2:
The patent modifies the fault dictionary structure and parameters to be specific to electronic components, changing the diagnostic parameters from general equipment parameters to component-specific parameters such as electrical characteristics, thermal behavior, and mechanical properties relevant to electronic components. This parameter transformation maintains the speed advantage of dictionary methods while achieving component-level diagnostic accuracy.
Data Source
AI summary
Method and system for performing close-loop analysis to electronic component failures are provided. The system establishes an electronic component fault tree of physics of failure (FTPF), converts the FTPF into a failure locating fault tree, establishes an electronic component fault dictionary with the cause of failure mechanism corresponding to failure characteristics, and performs close-loop analysis to the electronic component according to the fault tree and the fault dictionary. According to the disclosure, it is possible to locate the electronic component fault in the internal physical structure by the failure locating fault tree, to give a clear failure path, to quickly identify the failure mechanism corresponding to the electronic component failure mode by analyzing the failure characteristic vector in the fault dictionary, and to determine the mechanism factors and influencing factors of relevant failure mechanism by the FTPF, thereby achieving fast and accurate locating and diagnosis for the electronic component failure.