Electronic System Scan Comparison for Tamper Detection
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing electronic systems are vulnerable to tampering, which can occur between the time of manufacture and use, making it difficult to detect unauthorized modifications or damage.
Innovation Solution
A system and method that uses scanning and imaging technologies, combined with pattern recognition, to generate and compare field scans of electronic systems at different times, identifying differences through techniques like subtractive filtering to detect tampering.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If scanning and imaging technologies are used to detect modifications, then detection capability is improved, but device complexity increases
Solution Approach 1:
The system segments the detection process into distinct phases: baseline scanning at manufacture, field scanning at deployment, and comparative analysis. Each phase uses specialized scanning technologies (electromagnetic, optical, acoustic) that can be independently selected and optimized, reducing overall system complexity while maintaining high detection capability.
Solution Approach 2:
The patent introduces an intermediary comparative analysis system that bridges baseline scans and field scans. This intermediary layer processes and compares scan data, identifying modifications without requiring direct integration of all scanning technologies into a single complex device.
2Measurement precision
If multiple scanning technologies are employed, then measurement precision is improved, but ease of operation deteriorates
Solution Approach 1:
The system performs self-service by automatically executing predetermined routines during field scanning and autonomously comparing scan results against baseline data. The electronic system scans itself without requiring external intervention, simplifying operation while maintaining high measurement precision through multiple scanning technologies.
Solution Approach 2:
Baseline scans are performed in advance at the manufacturing site, establishing a reference database before deployment. This preliminary action eliminates the need for manual setup and comparison operations in the field, improving ease of operation while maintaining measurement precision through consistent baseline references.
3Reliability
If baseline scans are created at the manufacturing site, then reliability is improved, but loss of time occurs during transit
Solution Approach 1:
Baseline scans are created in advance at the manufacturing site, establishing a reference database before the electronic system is shipped. This preliminary action ensures reliability by capturing the system's authentic state under controlled conditions, while the actual detection occurs rapidly at deployment, minimizing time loss during transit.
Solution Approach 2:
The system creates a digital copy (baseline scan) of the electronic system's physical and functional state at manufacture. This copy can be stored and transmitted efficiently, allowing rapid comparison at the field site without requiring the physical presence of the original manufacturing environment, thus reducing time loss.
Data Source
AI summary
Embodiments are disclosed for techniques to detect electronic system modification. The techniques include causing an electronic system to perform a predetermined set of routines. The techniques also include generating field scans of the electronic system while the predetermined set of routines is performed. The techniques further include comparing the field scans to baseline scans of the electronic system. Additionally, the techniques include determining that one of the field scans and one of the baseline scans are different. Further, the techniques include identifying at least one difference between the one field scan and the one baseline scan.