Electronic Stop Device for Light Field Microscopy Out-of-Focus Signal Suppression
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Solution Overview
Problem
Current light field microscopy techniques face challenges in effectively suppressing out-of-focus signals, leading to reduced image contrast and visibility of desired structures, especially in thick samples like the brain, due to complex and inflexible stop mechanisms that require precise positioning and orientation of slit stops.
Innovation Solution
An electronic stop device is introduced and arranged in the intermediate image plane of the detection beam path upstream of the multi-lens array, allowing for flexible adjustment and suppression of out-of-focus signals by restricting the effective field of view based on the position and shape of the illuminated portion, eliminating the need for complex relay systems and precise slit stop positioning.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If a multi-lens array is used for light field microscopy, then volume imaging capability is improved, but out-of-focus signals are not effectively suppressed leading to reduced image contrast
Solution Approach 1:
The detection beam path is segmented into multiple detection paths, each associated with a specific illumination angle. The stop device divides the field of view into multiple regions, with each region corresponding to light from a specific illumination angle, allowing selective detection of in-focus signals while suppressing out-of-focus signals from other angles
Solution Approach 2:
Different regions of the field of view are assigned different properties based on their corresponding illumination angles. Each region is optimized to detect light from a specific angle, creating local quality variations that enable angle-selective signal detection and suppression of out-of-focus contributions
2Object-affected harmful factors
If slit stop devices are used to suppress out-of-focus signals, then image contrast is improved, but device complexity increases due to precise positioning and orientation requirements
Solution Approach 1:
The complex mechanical slit stop positioning and orientation system is replaced with a stop device that defines angular regions more directly. The stop device structure inherently associates each field of view region with its corresponding illumination angle, eliminating the need for precise mechanical positioning and orientation of slit stops
Solution Approach 2:
The stop device serves multiple functions simultaneously: it defines the field of view regions, associates each region with its corresponding illumination angle, and suppresses out-of-focus signals. This multi-functionality reduces the need for separate positioning and orientation mechanisms
3Object-affected harmful factors
If the field of view is restricted to match the illuminated portion, then out-of-focus signal suppression is improved, but flexibility for varying illumination parameters is reduced
Solution Approach 1:
The stop device is designed to be dynamically adjustable, allowing the field of view regions and their associated illumination angles to be reconfigured. This enables the system to adapt to varying illumination parameters such as light sheet thickness and illumination angles while maintaining effective out-of-focus signal suppression
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution simplifies the suppression of out-of-focus light, improving image quality by reducing stray light and enhancing the visibility of structures within the depth of field, while maintaining flexibility for varying illumination angles and light sheet thicknesses, thus enabling clearer three-dimensional imaging of thick samples.
Implementation Method 1
a light source for emitting excitation light
Implementation Method 2
emission light emitted by the sample as a consequence of the irradiation by the excitation light
Implementation Method 3
a detection beam path having a microscope objective and a multi-lens array for guiding the emission light onto the two-dimensionally spatially resolving detector
Implementation Method 4
a multi-lens array for guiding the emission light
Data Source
AI summary
An apparatus and method for light field microscopy. The apparatus has a light source for emitting excitation light, an excitation beam path for guiding the excitation light onto and into a sample, a two-dimensionally spatially resolving detector for detecting emission light emitted by the sample as a consequence of the irradiation by the excitation light, and a detection beam path having a microscope objective and a multi-lens array for guiding the emission light onto the two-dimensionally spatially resolving detector. The two-dimensionally spatially resolving detector being arranged in the focal plane of the multi-lens array or in a plane optically conjugate thereto, the excitation beam path being configured to illuminate only a portion of the sample in a field of view of the detection beam path with excitation light, with a device, in particular a scanner, being present for variable positioning of the illuminated portion of the sample in the field of view of the detection beam path and with a variable stop device being present. The variable stop device being configured to restrict an effective field of view of the detection beam path on the basis of the position of the illuminated portion in the field of view. The stop device is an electronic stop device and/or the stop device is arranged in an intermediate image plane of the detection beam path upstream of the multi-lens array.


