Electroplating Base Structure With Shielded Residual Discharge
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Solution Overview
Problem
Conventional electroplating systems face challenges in efficiently cleaning plating solution residual from right-angle corners in the base structure, leading to high impedance and increased power consumption, which necessitates labor-intensive manual cleaning and prolonged maintenance.
Innovation Solution
The introduction of shield structures with discharging openings, bevels, and baffles in the base structure to guide and discharge plating solution residual during cleaning, enhancing efficiency and reducing the need for manual intervention.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of manufacture
If conventional base structure is used, then manufacturing is simple, but plating solution residual accumulates in right-angle corners causing high impedance and increased power consumption
Solution Approach 1:
The shield structure replaces conventional right-angle corners with asymmetric beveled edges at specific angles (e.g., 45 degrees). This asymmetric geometry prevents plating solution residual from accumulating in corners, eliminating the source of high impedance and reduced power consumption without significantly complicating manufacturing
Solution Approach 2:
The shield structure introduces curved surfaces and rounded transitions instead of sharp right-angle corners. This curvature prevents residual accumulation by eliminating crevices where plating solution can pool, thereby reducing impedance and power consumption while maintaining manufacturability through standard forming processes
2Device complexity
If conventional base structure is used, then structure is simple, but manual cleaning is required consuming labor and time
Solution Approach 1:
The shield structure with beveled edges and curved surfaces is designed to be self-cleaning. During electroplating operation, the geometry naturally directs plating solution flow to flush residuals outward, eliminating the need for manual cleaning intervention and maximizing system uptime without adding complex automated cleaning mechanisms
Solution Approach 2:
Instead of designing for residual accumulation and then cleaning, the shield structure inverts the approach by designing geometry that actively prevents residual accumulation in the first place. The beveled and curved surfaces redirect flow to continuously flush residuals away from critical areas, eliminating manual cleaning requirements
3Loss of substance
If conventional base structure is used, then water consumption is low, but cleaning effectiveness is poor
Solution Approach 1:
The curved surfaces of the shield structure optimize fluid dynamics during cleaning operations. The curvature directs water flow more effectively across surfaces, improving cleaning effectiveness with reduced water consumption by eliminating dead zones where residuals would otherwise accumulate
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This design improves cleaning efficiency, reduces water and energy consumption, decreases maintenance time, and saves critical human resources, while maintaining low impedance and preventing residual reentry.
Implementation Method 1
a plurality of bevels, each of the plurality of bevels corresponding to each of the plurality of discharging openings and configured to guide the plating solution residual toward the corresponding discharging opening in the cleaning procedure
Implementation Method 2
During the manufacturing of the semiconductor devices, various processing steps are used to fabricate integrated circuits on a semiconductor wafer. Examples of processing steps include surface passivation, photolithography, ion implantation, etching, plasma ashing, thermal treatments, chemical vapor deposition (CVD), atomic layer deposition (ALD), physical vapor deposition (PVD), molecular beam epitaxy (MBE), electroplating
Data Source
AI summary
A base structure in an electroplating system is provided. The base structure includes: includes: an annular member; a contact ring attached to an inner surface of the annular member and configured to be electrically connected to a wafer in an electroplating process; and a pair of shield structures attached to an upper surface of the annular member and extending in an vertical direction. Each of the pair of shield structures includes: a curved plate comprising a plurality of discharging openings, wherein plating solution residual is discharged through the plurality of discharging openings in a cleaning procedure; and a plurality of bevels, each of the plurality of bevels corresponding to each of the plurality of discharging openings and configured to guide the plating solution residual toward the corresponding discharging opening in the cleaning procedure.


