Electrostatic Beam Combiner for High and Low Energy Ion Alignment

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Solution Overview

Problem

Existing methods for combining ion beams of dramatically different energies using magnetic lenses are energy-intensive and can affect electron microscope operations, and they do not accurately steer different isotopes of the same energy.

Innovation Solution

An electrostatic beam combiner with a high-energy particle beam source and a low-energy particle beam source, utilizing an electrostatic spherical analyzer and electrostatic deflectors to combine beams of 200 keV to several MeV and 10 to 50 keV energies, allowing independent adjustment of the high-energy beam's entry angle and point to align coaxially with a low-energy beam, enabling efficient simulation of radiation damage in materials.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If magnetic lenses are used to combine high energy and low energy ion beams, then beam combination is achieved, but energy consumption increases and electron microscope operation is affected

Engineering Contradiction:
Improvebeam combination capabilityVSAvoidenergy consumption
Core Design Contradiction:
Adaptability or versatilityVSUse of energy by moving object

Solution Approach 1:

The patent replaces magnetic lenses with electrostatic deflectors and an electrostatic spherical analyzer to combine ion beams. This substitution eliminates the need for magnetic fields, reducing energy consumption and avoiding interference with electron microscope operations while maintaining the capability to combine high energy and low energy ion beams

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The electrostatic spherical analyzer acts as an intermediary device that receives both high energy and low energy ion beams, processes them through electrostatic fields, and outputs a combined beam. This intermediary approach enables beam combination without direct interaction between the beam sources, reducing energy requirements and avoiding electron microscope interference

Inventive Principle:
Principle #24Intermediary (Mediator)

2Ease of operation

If steering magnets are used to steer ion beams, then beam direction control is achieved, but different isotopes of the same energy are not bent by the same amount

Engineering Contradiction:
Improvebeam direction controlVSAvoidisotope steering accuracy
Core Design Contradiction:
Ease of operationVSManufacturing precision

Solution Approach 1:

The patent changes the steering mechanism from magnetic fields (which depend on velocity and mass) to electrostatic fields (which depend on charge and position). The electrostatic deflectors apply forces based on charge rather than velocity, and the spherical analyzer uses radial electrostatic fields that bend all ions of the same energy by the same amount regardless of isotope, achieving precise steering accuracy for mixed isotopic beams

Inventive Principle:
Principle #35Parameter changes

3Productivity

If magnetic lenses are used for beam combination, then single combined beam is produced, but device complexity and energy intensity increase

Engineering Contradiction:
Improvebeam combination efficiencyVSAvoidsystem complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The patent replaces complex magnetic lens systems with a combination of electrostatic deflectors and a spherical analyzer. This substitution simplifies the overall system by eliminating the need for complex magnetic field generation and control mechanisms, reducing device complexity while maintaining high beam combination efficiency

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The electrostatic spherical analyzer serves multiple functions: it acts as both a beam steering element and a beam combining element for different energy ions. This multi-functionality reduces the number of separate components needed, simplifying the overall device while maintaining high productivity in beam combination

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This solution allows for a high-brightness combined ion beam that simulates years or decades of reactor exposure in minutes or hours, enabling real-time imaging of radiation damage mechanisms without introducing non-native elements, and maintains the integrity of electron microscope operations.

Implementation Method 1

A voltage applied between the inner and outer shells so as to bend the second particle beam of low energy along a curve

Methodology Applied
Scientific EffectElectrostatic field: Electric Field

Implementation Method 2

The aperture allows the first particle beam of high energy to be steered by two spaced apart electrostatic deflectors

Methodology Applied
Scientific EffectElectrostatic deflection: Electric Field

Data Source

PatentUS10361064B1Beam combiner
Publication Date: 2019.07.23 NATIONAL ELECTROSTATICS CORP
  • US10361064B1 patent drawing
  • US10361064B1 patent drawing
  • US10361064B1 patent drawing

AI summary

An electrostatic particle beam combiner for creating a single source combining the properties of two particle beams which form a high brightness source of a selected mixture of ions of varying element types and energies. An electrostatic spherical lens is arranged to bend a low energy second particle beam along a circular path and thereafter to impinge on a surface of a sample, e.g., within a transmission electron microscope. A beam of high energy is injected into the electrostatic spherical lens through an aperture in the outer shell and steered by two spaced apart electrostatic deflectors so that the angle of entry and the point of entry can be independently adjusted so that the high energy beam leaves the spherical lens along a path which is coaxial and coincident with the second particle beam of low energy.