Electrostatic Chuck Protrusion Arrangement for Temperature Uniformity

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Solution Overview

Problem

Existing electrostatic chucks in plasma processing apparatuses face challenges in uniform temperature control during chip formation on semiconductor substrates due to non-uniform contact with protrusions, leading to variations in processing quality across different regions.

Innovation Solution

The electrostatic chuck features a circular placing region with protrusions arranged at regular intervals on concentric circles, ensuring that protrusions are not aligned on the same straight line from the center, reducing the number of protrusions in contact with each chip forming region and minimizing temperature non-uniformity.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If protrusions are arranged in a conventional grid pattern, then the structure is simple and easy to manufacture, but the number of protrusions contacting each chip forming region varies significantly, causing temperature non-uniformity

Engineering Contradiction:
Improvetemperature uniformityVSAvoidprotrusion arrangement complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The placing region is divided into multiple concentric circular zones, with each zone containing a specific number of protrusions arranged at regular angular intervals. This segmentation approach ensures that chip forming regions at different radial positions contact a more uniform number of protrusions, reducing temperature non-uniformity while maintaining manufacturing feasibility.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The density and angular positioning of protrusions are optimized for different local regions of the substrate. Inner circular regions have different protrusion characteristics compared to outer circular regions, allowing each local area to achieve optimal thermal contact uniformity tailored to its specific geometry and processing requirements.

Inventive Principle:
Principle #3Local quality

2Temperature

If protrusions are arranged to maximize contact with chip forming regions, then thermal transfer is improved, but the contact becomes non-uniform across different regions, leading to temperature variations

Engineering Contradiction:
Improvetemperature uniformityVSAvoidprocessing uniformity
Core Design Contradiction:
TemperatureVSManufacturing precision

Solution Approach 1:

The concentric circular arrangement with regular angular spacing creates an equipotential distribution of protrusions, where each chip forming region contacts approximately the same number of protrusions regardless of its position on the substrate. This equalizes the thermal contact conditions across the entire placing region, eliminating temperature variations between different processing zones.

Inventive Principle:
Principle #12Equipotentiality

3Device complexity

If a simple grid pattern is used for protrusions, then device complexity is low, but temperature control uniformity during chip formation deteriorates

Engineering Contradiction:
Improveprotrusion arrangementVSAvoidtemperature uniformity
Core Design Contradiction:
Device complexityVSTemperature

Solution Approach 1:

The conventional linear grid pattern is replaced with concentric circular arrangements. This curvature-based configuration naturally adapts to the circular geometry of the substrate and chip forming regions, ensuring uniform radial distribution of protrusions. The circular pattern maintains relative simplicity in manufacturing while achieving superior temperature uniformity compared to grid patterns.

Inventive Principle:
Principle #14Spheroidality (Curvature)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration reduces non-uniformity in the number of protrusions contacting each chip forming region, thereby minimizing temperature differences and improving processing uniformity across the substrate, enhancing the quality of plasma processing.

Implementation Method 1

an electrostatic chuck that attracts the processing target object by an electrostatic force within a processing container

Methodology Applied
Scientific EffectElectrostatic force: Electrostatics

Implementation Method 2

a plurality of protrusions configured to protrude from the bottom surface... the plurality of protrusions is in contact with the processing target object to form a plurality of thermal transfer paths

Methodology Applied
Scientific EffectThermal conduction: Conduction (thermal)

Data Source

PatentUS10593522B2Electrostatic chuck, placing table and plasma processing apparatus
Publication Date: 2020.03.17 TOKYO ELECTRON LTD
  • US10593522B2 patent drawing
  • US10593522B2 patent drawing
  • US10593522B2 patent drawing

AI summary

Disclosed is an electrostatic chuck including a circular placing region configured to place a processing target object thereon. The placing region includes a bottom surface and a plurality of protrusions configured to protrude from the bottom surface. Further, the plurality of protrusions is formed at a plurality of positions set at a regular interval on each of a plurality of circles set concentrically and at a regular interval around a center of the placing region. Furthermore, among the plurality of positions, a plurality of positions set on each of any two adjacent circles is set not to be positioned on the same straight line extending from the center.