Electrostatic Chuck Flat-Plate Structure for Uniform Plasma Density

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Solution Overview

Problem

Existing electrostatic chucks in semiconductor manufacturing processes face challenges in achieving uniform plasma density distribution, which can lead to defects and non-uniformities in semiconductor devices.

Innovation Solution

The electrostatic chuck design includes an upper plate with a center region and an edge region on the same plane, featuring a focus ring, heater, substrate adhesion electrode, cooling channel, and gas flow paths, ensuring uniform thickness and alignment across the substrate area.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If the upper plate has different thickness in center and edge regions, then it is easier to manufacture, but plasma uniformity deteriorates

Engineering Contradiction:
Improveplasma uniformityVSAvoidupper plate manufacturing
Core Design Contradiction:
Manufacturing precisionVSEase of manufacture

Solution Approach 1:

The patent applies local quality by positioning specific components (heater, cooling channels, gas flow paths) in the edge region rather than uniformly distributing them. This localized arrangement creates intentional non-uniformity in the upper plate structure to compensate for plasma density variations, achieving uniform plasma distribution across the substrate while maintaining manufacturing feasibility.

Inventive Principle:
Principle #3Local quality

2Manufacturing precision

If the edge region is positioned at a different plane level, then structural support is improved, but plasma density uniformity deteriorates

Engineering Contradiction:
Improveplasma density uniformityVSAvoidstructural support
Core Design Contradiction:
Manufacturing precisionVSStrength

Solution Approach 1:

The patent applies equipotentiality by ensuring the upper surface of the upper plate is substantially flat across both center and edge regions. This creates an equipotential surface for plasma generation, ensuring uniform electric field distribution and consistent plasma density across the substrate area, while the lower plate provides the necessary structural support from below.

Inventive Principle:
Principle #12Equipotentiality

3Manufacturing precision

If multiple components are arranged in the edge region, then plasma uniformity is enhanced, but device complexity increases

Engineering Contradiction:
Improveplasma uniformityVSAvoidcomponent arrangement
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent applies merging by integrating multiple functional components (heater, cooling channels, gas flow paths) into the edge region of the upper plate. This consolidation of components in a specific spatial zone achieves plasma uniformity through coordinated thermal and gas flow management while avoiding the need for separate complex systems for each function.

Inventive Principle:
Principle #5Merging (Combining)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This design enhances plasma uniformity by maintaining consistent plasma density distribution, improving the quality and consistency of semiconductor manufacturing processes.

Implementation Method 1

The electrostatic chuck firmly secures the substrate using electrostatic force, thereby preventing the substrate from moving or wobble

Methodology Applied
Scientific EffectElectrostatic force: Electrostatics

Implementation Method 2

a heater in the upper plate

Methodology Applied
Scientific EffectThermal conduction: Conduction (thermal)

Implementation Method 3

a cooling channel in the lower plate, wherein the cooling channel is configured to allow coolant to flow therethrough

Methodology Applied
Scientific EffectConvection: Convection

Data Source

PatentUS20250385117A1Electrostatic chuck and plasma processing apparatus including the same
Publication Date: 2025.12.18 SAMSUNG ELECTRONICS CO LTD
  • US20250385117A1 patent drawing
  • US20250385117A1 patent drawing
  • US20250385117A1 patent drawing

AI summary

Provided is an electrostatic chuck and a plasma processing apparatus including same, the electrostatic chuck including: an upper plate including an upper surface, the upper surface including a center region configured to have a substrate mounted thereto and an edge region surrounding the center region; a lower plate under the upper plate and supporting the upper plate; and a focus ring on the edge region, wherein the center region and the edge region are on the same plane, and wherein a thickness of the upper plate in the center region is the same as a thickness of the upper plate in the edge region.