Element Array Circuit Readout for Fast, Precise Sensor Measurement
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing element array circuits, such as infrared detection circuits, face challenges in providing measured values quickly with high accuracy due to issues like combined output resistance and finite gains affecting operational amplifiers.
Innovation Solution
The proposed element array circuit includes a configuration with row and column lines, operational amplifiers, capacitors, and switches, where parasitic capacitance is charged for a specific time to allow accurate measurement of output voltage by converting current into voltage through capacitors and controlling switch states.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional operational amplifier configurations are used in element array circuits, then the circuit structure is simple, but measurement precision is reduced due to combined output resistance and finite gains effects
Solution Approach 1:
The patent divides the operational amplifier circuit into multiple independent operational amplifiers, each handling a specific column or row of the sensor array. This segmentation isolates the output resistance and finite gain effects to individual operational amplifiers, preventing their combined effects from degrading overall measurement precision while maintaining manageable circuit complexity through modular design.
Solution Approach 2:
The patent introduces additional operational amplifiers as intermediary elements between the sensor array and the readout circuitry. These intermediary operational amplifiers buffer and condition the signals, isolating the sensitive measurement nodes from the effects of output resistance and finite gains, thereby improving measurement precision without significantly increasing overall system complexity.
2Productivity
If fast measurement is implemented in element array circuits, then productivity increases, but measurement precision deteriorates due to parasitic capacitance effects
Solution Approach 1:
The patent implements a two-stage measurement process where parasitic capacitance is charged or discharged in advance (pre-conditioning) before the actual measurement is performed. This preliminary action removes the parasitic capacitance effects that would otherwise limit measurement speed, allowing fast measurements to be performed without sacrificing precision.
Solution Approach 2:
The patent employs periodic switching of measurement modes, alternating between a parasitic capacitance compensation phase and a measurement phase. During the compensation phase, parasitic capacitance effects are nulled; during the measurement phase, precise readings are taken. This periodic action enables both fast measurement response and high precision by systematically eliminating parasitic effects before each measurement.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration enables rapid and precise measurement of resistance values by minimizing parasitic capacitance effects, improving the accuracy and speed of infrared detection, temperature sensing, and strain sensing applications.
Implementation Method 1
one or more conversion elements coupled to the negative input terminal and the output terminal of corresponding one of the one or more operational amplifiers, and each configured to convert a current flowing through one of the second wiring lines that is coupled to the negative input terminal into a voltage
Data Source
Figure 1
Figure 2
Figure 3
AI summary
An element array circuit (1; 1B; 1C; 2; 3; 3A; 4) includes one or more first wiring lines (A (A1 to Am)), second wiring lines (B (B1 to Bn)), impedance elements (R (R(1, 1) to R(m, n)); SC (SC(1, 1) to SC(m, n))), one or more operational amplifiers (OP (OP1 to OPn)), one or more conversion elements (CP (CP1 to CPn); RE (RE1 to REn); D (D1 to Dn)), and one or more switchers (SW (SW1 to SWn)). The second wiring lines each extend in a direction different from a direction of extension of the first wiring lines. The impedance elements are each coupled to both one of the one or more first wiring lines and one of the second wiring lines. The operational amplifiers each include a positive input terminal (T1), a negative input terminal (T2) couplable to one of the second wiring lines, and an output terminal (T3). The conversion elements are each coupled to the negative input terminal and the output terminal, and each convert a current flowing through the second wiring line coupled to the negative input terminal into a voltage. The switchers are each coupled to one of the conversion elements and come into a conducting state or a nonconducting state.