Ellipsoidal Reflecting Surface for Wireless Terminal Testing
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Current wireless terminal testing systems are inefficient due to low testing speed, large size, high manufacturing costs, and limited application scope, primarily because they require a device under test to be irradiated with a plane wave and need to be positioned at a far field distance, leading to complex and costly setups.
Innovation Solution
A system and method utilizing a reflecting surface and rotating mechanism to converge wireless signals from a wireless terminal to a test antenna, achieving in-phase superposition and power combining, allowing for faster testing with reduced distance between the device and antenna, and eliminating the need for a plane wave irradiation, using an absorbing screen to block direct signals and a non-metallic support to prevent interference.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the device under test is irradiated with plane wave and positioned at far field distance, then measurement accuracy is improved, but system size and manufacturing cost increase
Solution Approach 1:
The patent employs an ellipsoidal reflecting surface instead of a plane wave setup. The ellipsoidal geometry allows signals radiated in multiple directions to be focused onto the test antenna at one focus, while the device under test is placed at the other focus. This curved surface approach replaces the requirement for far-field plane wave illumination, enabling accurate total radiation power measurement in a compact near-field configuration.
Solution Approach 2:
The patent introduces an ellipsoidal reflecting surface as an intermediary element between the device under test and the test antenna. This reflecting surface acts as a mediator that collects signals radiated in various directions from the device and redirects them to converge at the test antenna, achieving signal concentration without requiring far-field positioning or plane wave generation.
2Measurement precision
If the device under test is irradiated with plane wave at far field distance, then measurement accuracy is improved, but testing speed decreases
Solution Approach 1:
The ellipsoidal reflecting surface enables the system to capture and focus signals radiated in multiple directions simultaneously. By rotating the device under test, the system can measure total radiation power more quickly compared to traditional methods that require sequential scanning or far-field plane wave illumination, thus improving testing speed while maintaining measurement accuracy.
Solution Approach 2:
The patent implements continuous rotation of the device under test during measurement, allowing the system to continuously collect radiation signals from different angles. This continuous measurement approach, combined with the ellipsoidal focusing geometry, enables faster data acquisition compared to stop-and-measure methods or far-field scanning techniques.
3Measurement precision
If multiple operations for repeating are performed, then measurement completeness is improved, but testing efficiency decreases
Solution Approach 1:
The patent combines multiple measurement operations into a single integrated system. The ellipsoidal reflecting surface simultaneously captures signals radiated in all directions, and the rotation mechanism allows comprehensive angular coverage in one continuous operation. This merging of multiple measurement functions into a unified approach eliminates the need for repeated separate operations, improving testing efficiency while ensuring measurement completeness.
Solution Approach 2:
The patent performs preliminary positioning of the device under test at the focus of the ellipsoidal surface before measurement begins. This preliminary setup ensures that all subsequent measurements are taken from the optimal position, eliminating the need for repeated repositioning or multiple operations to achieve complete angular coverage, thus improving testing efficiency.
4Measurement precision
If the distance between device under test and test antenna is large, then plane wave irradiation is achieved, but system complexity and cost increase
Solution Approach 1:
The patent replaces the complex far-field plane wave generation requirement with a simple ellipsoidal reflecting surface. By placing the device under test and test antenna at the two foci of the ellipsoid, the system achieves signal focusing without requiring large distances or complex plane wave generation equipment, thus reducing system complexity while maintaining measurement quality.
Solution Approach 2:
The patent changes the working parameter from far-field distance to near-field ellipsoidal geometry. Instead of maintaining a large distance between the device under test and test antenna to achieve plane wave conditions, the system uses the ellipsoidal reflecting surface to focus near-field signals, fundamentally changing the operational parameters to simplify the overall system configuration.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach results in higher testing speed, reduced repetition errors, stable results, lower costs, and a more compact system design, suitable for wireless performance authentication, development, and production, with improved efficiency and reduced size.
Implementation Method 1
a reflecting surface, configured to totally reflect one or more wireless signals emitted by the wireless terminal
Implementation Method 2
an absorbing screen, configured to absorb a radio wave
Data Source
Figure 1~2
Figure 3~4a
Figure 4b~4c
AI summary
Disclosed are a wireless terminal testing system and a method for controlling same, said system comprising: a device to be tested, the device to be tested being a wireless terminal; a reflective surface, used for total reflection of a wireless signal emitted by the wireless terminal; a rotation mechanism, used for securing the device to be tested and driving the device to be tested to rotate, such that the wireless signals emitted by the wireless terminal in multiple directions are directed at the reflective surface; a test antenna, used for receiving a wireless signal; an absorbing screen; the positional relationship of the device to be tested, the test antenna, and the reflective surface correspond to a single ellipsoidal plane, wherein the device to be tested and the test antenna are arranged at two foci of the same ellipsoidal plane, and the reflective surface is arranged on the ellipsoidal plane; the absorbing screen is arranged on the straight line between the device to be tested and the test antenna. The wireless terminal testing system of the embodiments of the present invention simplifies system structure, and prevents test operations being repeated multiple times, thus the invention has the advantages of small repetition error of test results, stable test results, high testing efficiency, and low cost.